Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films

Simple item page
dc.contributor.authorIonescu, Men_AU
dc.contributor.authorZhao, Yen_AU
dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorCohen, DDen_AU
dc.contributor.authorStelcer, Een_AU
dc.contributor.authorPrior, MJen_AU
dc.date.accessioned2009-11-08T23:30:00Zen_AU
dc.date.accessioned2010-04-30T05:06:24Zen_AU
dc.date.available2009-11-08T23:30:00Zen_AU
dc.date.available2010-04-30T05:06:24Zen_AU
dc.date.issued2008-04en_AU
dc.date.statistics2008-04en_AU
dc.description.abstractOxygen incorporation in MgB2 thin films during their fabrication process has a strong influence on the future properties of the films, and was studied by Elastic Recoil Detection Analysis with heavy ions and a time-of-flight detection. A series of MgB2 thin film samples were analyzed, including films produced in situ on Al2O3-C and Si (0 0 1) substrates (with higher Tc and lower Tc) with an “on-axis” geometry, and films produced in situ with an “off-axis” geometry. The amount of oxygen detected in these films appears to be correlated with the Tc of the films, the higher the Tc the lower the oxygen content. The superconducting properties of the examined thin films are discussed in the context of the ERDA results. © 2008, Elsevier Ltd.en_AU
dc.identifier.citationIonescu, M., Zhao, Y., Siegele, R., Cohen, D. D., Stelcer, E., & Prior, M. (2008). Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 266(8), 1701-1704. doi:10.1016/j.nimb.2008.01.033en_AU
dc.identifier.govdoc1410en_AU
dc.identifier.issn0168-583Xen_AU
dc.identifier.issue8en_AU
dc.identifier.journaltitleNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atomsen_AU
dc.identifier.pagination1701-1704en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/j.nimb.2008.01.033en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/2231en_AU
dc.identifier.volume266en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectThin filmsen_AU
dc.subjectHeavy ionsen_AU
dc.subjectOxygenen_AU
dc.subjectTime-of-flight methoden_AU
dc.subjectDetectionen_AU
dc.subjectSuperconductivityen_AU
dc.titleHeavy ion ToF analysis of oxygen incorporation in MgB2 thin filmsen_AU
dc.typeJournal Articleen_AU
Files
License bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
license.txt
Size:
1.79 KB
Format:
Plain Text
Description:
Download
Collections
Journal Articles