On the composition of the top layer of microphase separated thin PS-PEO films

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dc.contributor.authorNeto, Cen_AU
dc.contributor.authorJames, Men_AU
dc.contributor.authorTelford, AMen_AU
dc.date.accessioned2009-08-18T07:05:35Zen_AU
dc.date.accessioned2010-04-30T05:04:41Zen_AU
dc.date.available2009-08-18T07:05:35Zen_AU
dc.date.available2010-04-30T05:04:41Zen_AU
dc.date.issued2009-07-14en_AU
dc.date.statistics2009-07-14en_AU
dc.description.abstractThe topography and surface composition of thin films (ca. 100 nm) of a polystyrene-b-poly(ethylene oxide) (PS-PEO) block copolymer are investigated using a suite of complementary techniques, namely tapping mode atomic force microscopy (AFM), optical microscopy, X-ray photoelectron spectroscopy (XPS), neutron reflectometry, and wettability measurements. The copolymer films separate into lamellar structures oriented parallel to the silicon substrate, and bicontintious and island/hole morphologies characteristic of this arrangement appear. Even though the crystalline topography of the film's surface and its wettability properties suggest the presence of 11130 oil the top surface, XPS and neutron reflectometry data point undoubtedly to the presence of a top layer of PS at the air/film interface. Tapping mode AFM images unequivocally demonstrate that in air only one block is present at the air/film interface. Neutron reflectometry data identify the nature of each phase-separated layer within the film. This finding differs from a model of domain arrangement proposed in a classic and much-cited paper oil these systems (Macromolecules 1979, 12, 323). After exposure to water, PEO blocks rearrange and access the top surface of the film. After many hours of thermal annealing, both PS and PEO blocks can be made to appear at the film/air interface, within isolated droplets formed upon Film dewetting. © 2009, American Chemical Societyen_AU
dc.identifier.citationNeto, C., James, M., & Telford, A. M. (2009). On the composition of the top layer of microphase separated thin PS-PEO films. Macromolecules, 42(13), 4801-4808. doi:10.1021/ma900690een_AU
dc.identifier.govdoc1306en_AU
dc.identifier.issn0024-9297en_AU
dc.identifier.issue13en_AU
dc.identifier.journaltitleMacromoleculesen_AU
dc.identifier.pagination4801-4808en_AU
dc.identifier.urihttp://dx.doi.org/10.1021/ma900690een_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/1630en_AU
dc.identifier.volume42en_AU
dc.language.isoenen_AU
dc.publisherAmerican Chemical Societyen_AU
dc.subjectAtomic force microscopyen_AU
dc.subjectX-ray photoelectron spectroscopyen_AU
dc.subjectThin filmsen_AU
dc.subjectCrystallizationen_AU
dc.subjectPolystyreneen_AU
dc.subjectCopolymersen_AU
dc.titleOn the composition of the top layer of microphase separated thin PS-PEO filmsen_AU
dc.typeJournal Articleen_AU
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