ToF-SIMS characterisation of methane- and hydrogen-plasma-modified graphite using principal component analysis.

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dc.contributor.authorDeslandes, Aen_AU
dc.contributor.authorJasieniak, Men_AU
dc.contributor.authorIonescu, Men_AU
dc.contributor.authorShapter, JGen_AU
dc.contributor.authorFairman, Cen_AU
dc.contributor.authorGooding, JJen_AU
dc.contributor.authorHibbert, DBen_AU
dc.contributor.authorQuinton, JSen_AU
dc.date.accessioned2009-08-20T06:52:06Zen_AU
dc.date.accessioned2010-04-30T05:04:33Zen_AU
dc.date.available2009-08-20T06:52:06Zen_AU
dc.date.available2010-04-30T05:04:33Zen_AU
dc.date.issued2009-03en_AU
dc.date.statistics2009-03en_AU
dc.description.abstractTime of flight secondary ion mass spectrometry (ToF-SIMS) has been used to determine the extent of surface modification of highly ordered pyrolytic graphite (HOPG) samples that were exposed to radio-frequency methane and hydrogen plasmas. The ToF-SIMS measurements were examined with the multivariate method of principal component analysis (PCA), to maximise the amount of spectral information retained in the analysis. This revealed that the plasma (methane or hydrogen plasma) modified HOPG exhibited greater hydrogen content than the pristine HOPG. The hydrogen content trends observed from the ToF-SIMS studies were also observed in elastic recoil detection analysis measurements. The application of the ToF-SIMS PCA method also showed that small hydrocarbon fragments were sputtered from the hydrogen-plasma-treated sample, characteristic of the formation of a plasma-damaged surface, whereas the methane-plasma-treated surface sputtered larger hydrocarbon fragments, which implies the growth of a polymer-like coating. Scanning tunnelling microscopy measurements of the modified surfaces showed surface features that are attributable to either etching or film growth after exposure to the hydrogen or methane plasma. © 2009, Wiley-Blackwell.en_AU
dc.identifier.citationDeslandes, A., Jasieniak, M., Ionescu, M., Shapter, J. G., Fairman, C., Gooding, J. J., Hibbert, D. B., & Quinton, J. S. (2009). ToF-SIMS characterisation of methane- and hydrogen-plasma-modified graphite using principal component analysis. Surface and Interface Analysis, 41(3), 216-224. doi:10.1002/sia.3010en_AU
dc.identifier.govdoc1296en_AU
dc.identifier.issn0142-2421en_AU
dc.identifier.issue3en_AU
dc.identifier.journaltitleSurface and Interface Analysisen_AU
dc.identifier.pagination216-224en_AU
dc.identifier.urihttp://dx.doi.org/10.1002/sia.3010en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/1697en_AU
dc.identifier.volume41en_AU
dc.language.isoenen_AU
dc.publisherWiley-Blackwellen_AU
dc.subjectGraphiteen_AU
dc.subjectPlasmaen_AU
dc.subjectHydrogenen_AU
dc.subjectMethaneen_AU
dc.subjectMass spectroscopyen_AU
dc.subjectTime-of-flight methoden_AU
dc.titleToF-SIMS characterisation of methane- and hydrogen-plasma-modified graphite using principal component analysis.en_AU
dc.typeJournal Articleen_AU
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