Temperature-dependent EXAFS analysis of embedded Pt nanocrystals

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dc.contributor.authorGiulian, Ren_AU
dc.contributor.authorAraujo, LLen_AU
dc.contributor.authorKluth, Pen_AU
dc.contributor.authorSprouster, DJen_AU
dc.contributor.authorSchnohr, CSen_AU
dc.contributor.authorForan, GJen_AU
dc.contributor.authorRidgway, MCen_AU
dc.date.accessioned2009-06-09T05:46:50Zen_AU
dc.date.accessioned2010-04-30T05:04:16Zen_AU
dc.date.available2009-06-09T05:46:50Zen_AU
dc.date.available2010-04-30T05:04:16Zen_AU
dc.date.issued2009-04-15en_AU
dc.date.statistics2009-04-15en_AU
dc.description.abstractThe vibrational and thermal properties of embedded Pt nanocrystals (NCs) have been investigated with temperature-dependent extended x-ray absorption fine structure (EXAFS) spectroscopy. NCs of diameter 1.8-7.4 nm produced by ion implantation in amorphous SiO2 were analysed over the temperature range 20-295 K. An increase in Einstein temperature (similar to 194 K) relative to that of a Pt standard (similar to 179 K) was evident for the smallest NCs while those larger than similar to 2.0 nm exhibited values comparable to bulk material. Similarly, the thermal expansion of interatomic distances was lowest for small NCs. While the amorphous SiO2 matrix restricted the thermal expansion of interatomic distances, it did not have a significant influence on the mean vibrational frequency of embedded Pt NCs. Instead, the latter was governed by finite-size effects or, specifically, capillary pressure. © 2009, Institute of Physicsen_AU
dc.identifier.articlenumber155302en_AU
dc.identifier.citationGiulian, R., Araujo, L. L., Kluth, P., Sprouster, D. J., Schnohr, C. S., Foran, G. J., & Ridgway, M. C. (2009). Temperature-dependent EXAFS analysis of embedded Pt nanocrystals. Journal of Physics-Condensed Matter, 21(15), 155302. doi:10.1088/0953-8984/21/15/155302en_AU
dc.identifier.govdoc1277en_AU
dc.identifier.issn0953-8984en_AU
dc.identifier.issue15en_AU
dc.identifier.journaltitleJournal of Physics: Condensed Matteren_AU
dc.identifier.urihttp://dx.doi.org/10.1088/0953-8984/21/15/155302en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/1313en_AU
dc.identifier.volume21en_AU
dc.language.isoenen_AU
dc.publisherInstitute of Physicsen_AU
dc.subjectAbsorptionen_AU
dc.subjectThermal expansionen_AU
dc.subjectIon implantationen_AU
dc.subjectVibrational statesen_AU
dc.subjectSilicaen_AU
dc.subjectPlatinumen_AU
dc.titleTemperature-dependent EXAFS analysis of embedded Pt nanocrystalsen_AU
dc.typeJournal Articleen_AU
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