Adsorption at liquid interfaces: a comparison of multiple experimental techniques

dc.contributor.authorLaw, BMen_AU
dc.contributor.authorBrown, MDen_AU
dc.contributor.authorMarchand, Len_AU
dc.contributor.authorLurio, LBen_AU
dc.contributor.authorHamilton, WAen_AU
dc.contributor.authorKuzmenko, Ien_AU
dc.contributor.authorGog, Ten_AU
dc.contributor.authorSatija, Sen_AU
dc.contributor.authorWatkins, Een_AU
dc.contributor.authorMajewski, Jen_AU
dc.date.accessioned2009-06-11T05:30:24Zen_AU
dc.date.accessioned2010-04-30T05:03:51Zen_AU
dc.date.available2009-06-11T05:30:24Zen_AU
dc.date.available2010-04-30T05:03:51Zen_AU
dc.date.issued2009-02en_AU
dc.date.statistics2009-02en_AU
dc.description.abstractIt has proven to be a challenging task to quantitatively resolve the interfacial pro. le at diffuse interfaces, such as, the adsorption pro. le near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption pro. le that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry. © 2009, EDP Sciencesen_AU
dc.identifier.citationLaw, B. M., Brown, M. D., Marchand, L., Lurio, L. B., Hamilton, W. A., Kuzmenko, I., Gog, T., Satija, S., Watkins, & E., Majewski, J. (2009). Adsorption at liquid interfaces: a comparison of multiple experimental techniques. The European Physical Journal Special Topics, 167, 127-132. doi:10.1140/epjst/e2009-00947-2en_AU
dc.identifier.govdoc1251en_AU
dc.identifier.issn1951-6355en_AU
dc.identifier.journaltitleThe European Physical Journal Special Topicsen_AU
dc.identifier.pagination127-132en_AU
dc.identifier.urihttp://dx.doi.org/10.1140/epjst/e2009-00947-2en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/1340en_AU
dc.identifier.volume167en_AU
dc.language.isoenen_AU
dc.publisherEDP Sciencesen_AU
dc.subjectAdsorptionen_AU
dc.subjectNeutron reflectorsen_AU
dc.subjectEllipsometryen_AU
dc.subjectExperimental dataen_AU
dc.subjectInterfacesen_AU
dc.subjectX-ray sourcesen_AU
dc.titleAdsorption at liquid interfaces: a comparison of multiple experimental techniquesen_AU
dc.typeJournal Articleen_AU
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