Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy
dc.contributor.author | Zhao, Y | en_AU |
dc.contributor.author | Ionescu, M | en_AU |
dc.contributor.author | Dou, SX | en_AU |
dc.contributor.author | Liu, HK | en_AU |
dc.date.accessioned | 2009-11-16T05:58:53Z | en_AU |
dc.date.accessioned | 2010-04-30T05:02:26Z | en_AU |
dc.date.available | 2009-11-16T05:58:53Z | en_AU |
dc.date.available | 2010-04-30T05:02:26Z | en_AU |
dc.date.issued | 2007-06 | en_AU |
dc.date.statistics | 2007-06 | en_AU |
dc.description.abstract | The Rutherford backscattering (RBS) method has been employed to study the incorporation of oxygen into MgB2 films during their fabrication by pulsed-laser deposition (PLD). A series of MgB2 thin film samples were analyzed, including two films produced in situ on Al2O3 - c substrates (with higher T-c and lower T-c) with an on-axis geometry, one film produced in situ with an off-axis geometry, and one film produced ex situ, with a bulk-like T-c. The amount of oxygen detected by RBS, which is stable in the form of MgO, appears to be correlated with the T-c of the films, the higher the T-c the lower the oxygen content. The superconducting properties of the thin films are discussed in the context of the RBS results. © 2007, Institute of Electrical and Electronics Engineers (IEEE) | en_AU |
dc.identifier.citation | Zhao, Y., Ionescu, M., Dou, S. X., & Liu, H. K. (2007). Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy. IEEE Transactions on Applied Superconductivity, 17(2), 2875-2878. doi:10.1109/TASC.2007.899485 | en_AU |
dc.identifier.govdoc | 1150 | en_AU |
dc.identifier.issn | 1051-8223 | en_AU |
dc.identifier.issue | 2 | en_AU |
dc.identifier.journaltitle | IEEE Transactions on Applied Superconductivity | en_AU |
dc.identifier.pagination | 2875-2878 | en_AU |
dc.identifier.uri | http://dx.doi.org/10.1109/TASC.2007.899485 | en_AU |
dc.identifier.uri | http://apo.ansto.gov.au/dspace/handle/10238/2311 | en_AU |
dc.identifier.volume | 17 | en_AU |
dc.language.iso | en | en_AU |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_AU |
dc.subject | Thin films | en_AU |
dc.subject | Oxygen | en_AU |
dc.subject | Rutherford backscattering spectroscopy | en_AU |
dc.subject | Superconductivity | en_AU |
dc.subject | Magnesium | en_AU |
dc.subject | Deposition | en_AU |
dc.title | Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy | en_AU |
dc.type | Journal Article | en_AU |
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