Application of secondary ion mass spectrometry in studies of niobium segregation in niobium-doped titanium dioxide

dc.contributor.authorSheppard, LRen_AU
dc.contributor.authorAtanacio, AJen_AU
dc.contributor.authorBak, Ten_AU
dc.contributor.authorNowotny, Jen_AU
dc.contributor.authorPrince, KEen_AU
dc.date.accessioned2010-01-27T04:02:22Zen_AU
dc.date.accessioned2010-04-30T05:02:19Zen_AU
dc.date.available2010-01-27T04:02:22Zen_AU
dc.date.available2010-04-30T05:02:19Zen_AU
dc.date.issued2007en_AU
dc.date.statistics2007en_AU
dc.description.abstractSecondary ion mass spectrometry (SIMS) is a powerful technique in the study of materials that demonstrate compositional changes as a function of depth from the surface. This is due to the high chemical sensitivity of SIMS (sensitive to ppb) and potential for high depth resolution. However, as a semi-quantitative technique, the application of SIMS to quantitative studies can be problematic without knowledge of the appropriate calibration information, which must be obtained through the use of carefully prepared reference specimens. In the present work, SIMS is used in the investigation of surface segregation in niobium doped polycrystalline TiO2. This material has demonstrated important photo-catalytic properties with implications for alternative energy generation and environmentally-friendly water purification, but requires investigation in relation to surface versus bulk processing. The present paper demonstrates the use of SIMS in the quantitatively assessment of segregation in TiO2 and the development of a calibration curve. © 2007, The Australian Ceramic Societyen_AU
dc.identifier.citationSheppard, L. R., Atanacio, A. J., Bak, T., Nowotny, J., & Prince, K. E. (2007). Application of secondary ion mass spectrometry in studies of niobium segregation in niobium-doped titanium dioxide. Journal of the Australian Ceramic Society, 43(2), 92- 97.en_AU
dc.identifier.govdoc1142en_AU
dc.identifier.issn0004-881Xen_AU
dc.identifier.issue2en_AU
dc.identifier.journaltitleJournal of the Australian Ceramic Societyen_AU
dc.identifier.pagination92- 97en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/2770en_AU
dc.identifier.volume43en_AU
dc.language.isoenen_AU
dc.publisherThe Australian Ceramic Societyen_AU
dc.subjectTitaniumen_AU
dc.subjectNiobiumen_AU
dc.subjectSegregationen_AU
dc.subjectPhotocatalysisen_AU
dc.subjectCalibrationen_AU
dc.subjectMass spectroscopyen_AU
dc.titleApplication of secondary ion mass spectrometry in studies of niobium segregation in niobium-doped titanium dioxideen_AU
dc.typeJournal Articleen_AU
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
SHEPPARD_Application_Secondary_Ion_Mass_Spectrometry_2007.pdf
Size:
328.37 KB
Format:
Adobe Portable Document Format
Description:
License bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
1.79 KB
Format:
Plain Text
Description:
Collections