Probing the structure of nanochannal arrays by electrostatic force microscopy

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dc.contributor.authorMurugaraj, Pen_AU
dc.contributor.authorKumar, Nen_AU
dc.contributor.authorJakubov, Ten_AU
dc.contributor.authorMainwaring, DEen_AU
dc.contributor.authorSiegele, Ren_AU
dc.date.accessioned2012-06-05T00:34:46Zen_AU
dc.date.available2012-06-05T00:34:46Zen_AU
dc.date.issued2011-04-01en_AU
dc.date.statistics2012-06-05en_AU
dc.description.abstractElectrostatic force microscopy (EFM) represents a versitile tool for the characterisation of electric and dielectric structures at nanoscale which can be employed to provide charge distributions associated with such nanotopologies. EFM-phase profiles show only the variation of electrostatic force which is strongly influenced by the surface conductivity of nanostructured arrays providing improved definition compared to conventional AFM. Here we apply it to carbon nanochannel arrays embedded within polyimide dielectric matrices. © 2012 World Scientific Publishing Co.en_AU
dc.identifier.booktitleChemistry and Applications of Nonostructures: Reviews and Short Notes - Proceedings of the International Conference Nanomeetingen_AU
dc.identifier.citationMurugaraj, P., Kumar, N., Jakubov, T., Mainwaring, D. E. (2011). Probing the structure of nanochannal arrays by electrostatic force microscopy. International Conference Nanomeeting - 2011, 24th-27th May 2011. Minsk, Belarus. In V. E. Borisenko, S. V. Gaponenko, V.S. Gurin, C. H. Kam( Eds.), Physics, Chemistry and Applications of Nonostructures: Reviews and Short Notes - Proceedings of the International Conference Nanomeeting - 2011 (pp. 241-244). Singapore: World Scientific Publishing Company.en_AU
dc.identifier.editorsV. E. Borisenko, S. V. Gaponenko, V.S. Gurin, C. H. Kamen_AU
dc.identifier.govdoc4061en_AU
dc.identifier.isbn9789814343909en_AU
dc.identifier.pagination241-244en_AU
dc.identifier.placeofpublicationSingaporeen_AU
dc.identifier.urihttps://doi.org/10.1142/9789814343909_0059en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/4293en_AU
dc.language.isoenen_AU
dc.publisherWorld Scientific Publishing Co.en_AU
dc.subjectMicroscopyen_AU
dc.subjectNanostructuresen_AU
dc.subjectDielectric materialsen_AU
dc.subjectArray processorsen_AU
dc.subjectCarbonen_AU
dc.titleProbing the structure of nanochannal arrays by electrostatic force microscopyen_AU
dc.typeBook chapteren_AU
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