Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and x-ray reflectometry.

Simple item page
dc.contributor.authorVelinov, Ten_AU
dc.contributor.authorAhtapodov, Len_AU
dc.contributor.authorNelson, Aen_AU
dc.contributor.authorGateshki, Men_AU
dc.contributor.authorBivolarska, Men_AU
dc.date.accessioned2011-03-30T03:56:05Zen_AU
dc.date.available2011-03-30T03:56:05Zen_AU
dc.date.issued2011-01-31en_AU
dc.date.statistics2011-01-31en_AU
dc.description.abstractThickness and refractive index of Au films thermally evaporated onto glass substrates and with an underlayer of Cr are determined from surface plasmon resonance. The results for the thickness are found to agree very well with those from X-ray reflectivity when a simple model of layers with flat interfaces is used. Plasmon propagation along thin films is influenced by radiative damping due to scattering from surface roughness. To study this influence the surface roughness of the glass substrate, Cr an Au layers are measured by X-ray reflectometry and the results used to introduce three intermediate layers with effective refractive indices and thicknesses corresponding to the roughness. Then Fresnel's equations are used to fit the reflectivity and to deduce the layer properties. It is found that the roughness affects to a great extent the optical parameters of the Au films even when it is smaller than 1 nm. In particular, the absolute value of real part of the dielectric constant decreases while its imaginary part increases when those effects are not taken into account. © 2011, Elsevier Ltd.en_AU
dc.identifier.citationVelinov, T., Ahtapodov, L., Nelson, A., Gateshki, M., & Bivolarska, M. (2011). Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and x-ray reflectometry. Thin Solid Films, 519(7), 2093-2097. doi.10.1016/j.tsf.2010.10.059en_AU
dc.identifier.govdoc3324en_AU
dc.identifier.issn0040-6090en_AU
dc.identifier.issue7en_AU
dc.identifier.journaltitleThin Solid Filmsen_AU
dc.identifier.pagination2093-2097en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2010.10.059en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/3157en_AU
dc.identifier.volume519en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectEvaporationen_AU
dc.subjectOptical propertiesen_AU
dc.subjectThin filmsen_AU
dc.subjectGolden_AU
dc.subjectSurface propertiesen_AU
dc.subjectPlasmonsen_AU
dc.titleInfluence of the surface roughness on the properties of Au films measured by surface plasmon resonance and x-ray reflectometry.en_AU
dc.typeJournal Articleen_AU
Files
License bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:
Download
Collections
Journal Articles