The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns
dc.contributor.author | Fuentes-Montero, L | en_AU |
dc.contributor.author | Montero-Cabrera, ME | en_AU |
dc.contributor.author | Fuentes-Cobas, L | en_AU |
dc.date.accessioned | 2011-12-13T22:51:09Z | en_AU |
dc.date.available | 2011-12-13T22:51:09Z | en_AU |
dc.date.issued | 2011-02-01 | en_AU |
dc.date.statistics | 2011-12-14 | en_AU |
dc.description.abstract | A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented. Copyright © International Union of Crystallography | en_AU |
dc.identifier.citation | Fuentes-Montero, L., Montero-Cabrera, M. E., & Fuentes-Cobas, L. (2011). The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns. Journal of Applied Crystallography, 44(Part 1), 241-246. doi:10.1107/S0021889810048739 | en_AU |
dc.identifier.govdoc | 3815 | en_AU |
dc.identifier.issn | 0021-8898 | en_AU |
dc.identifier.issue | Part 1 | en_AU |
dc.identifier.journaltitle | Journal of Applied Crystallography | en_AU |
dc.identifier.pagination | 241-246 | en_AU |
dc.identifier.uri | http://dx.doi.org/10.1107/S0021889810048739 | en_AU |
dc.identifier.uri | http://apo.ansto.gov.au/dspace/handle/10238/3943 | en_AU |
dc.identifier.volume | 44 | en_AU |
dc.language.iso | en | en_AU |
dc.publisher | International Union of Crystallography | en_AU |
dc.subject | X-ray diffraction | en_AU |
dc.subject | Texture | en_AU |
dc.subject | Crystallography | en_AU |
dc.subject | Scattering | en_AU |
dc.subject | Polycrystals | en_AU |
dc.subject | Images | en_AU |
dc.title | The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns | en_AU |
dc.type | Journal Article | en_AU |
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