Calibration of a JSEM-200 electron microscope with a magnetic specimen pole-piece

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dc.contributor.authorBlake, RGen_AU
dc.contributor.authorJostsons, Aen_AU
dc.date.accessioned2007-11-22T04:13:25Zen_AU
dc.date.accessioned2010-04-30T04:28:07Zen_AU
dc.date.available2007-11-22T04:13:25Zen_AU
dc.date.available2010-04-30T04:28:07Zen_AU
dc.date.issued1980-02en_AU
dc.description.abstractThis report contains the results of a detailed calibration of the JSEM-200 scanning transmission electron microscope operated with a magnetic specimen pole-piece as supplied by JEOL (Japan Electron Optics Laboratory) Ltd. The microscopy, in this configuration, permits convenient examination of ferromagnetic specimens in the side-entry goniometer specimen stage with a point-to-point resolution better than 2.0 nm.en_AU
dc.identifier.citationBlake, R. G., & Jostsons, A. (1980). Calibration of a jsem-200 electron microscope with a magnetic specimen pole-piece (AAEC/E491). Lucas Heights, N.S.W.: Australian Atomic Energy Commission Research Establishment.en_AU
dc.identifier.govdoc95en_AU
dc.identifier.isbn0642596816en_AU
dc.identifier.otherAAEC-E-491en_AU
dc.identifier.placeofpublicationLucas Heights, New South Walesen_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/139en_AU
dc.language.isoen_auen_AU
dc.publisherAustralian Atomic Energy Commissionen_AU
dc.subjectCalibrationen_AU
dc.subjectCalibration standardsen_AU
dc.subjectElectron microscopesen_AU
dc.subjectMagnetic fieldsen_AU
dc.titleCalibration of a JSEM-200 electron microscope with a magnetic specimen pole-pieceen_AU
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