Grazing incidence x-ray studies of ultra-thin lumogen films.

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dc.contributor.authorKeough, SJen_AU
dc.contributor.authorHanley, TLen_AU
dc.contributor.authorWedding, ABen_AU
dc.contributor.authorQuinton, JSen_AU
dc.date.accessioned2008-02-13T05:01:29Zen_AU
dc.date.accessioned2010-04-30T05:01:56Zen_AU
dc.date.available2008-02-13T05:01:29Zen_AU
dc.date.available2010-04-30T05:01:56Zen_AU
dc.date.issued2007-12-15en_AU
dc.date.statistics2007-12en_AU
dc.description.abstractLumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than 2nm) spin-coated films reveal a second, apparently stable crystalline structure. © 2007, Elsevier Ltd.en_AU
dc.identifier.citationKeough, S. J., Hanley, T. L., Wedding, A. B., & Quinton, J. S. (2007). Grazing incidence x-ray studies of ultra-thin lumogen films. Surface Science, 601(24), 5744-5749. doi:10.1016/j.susc.2007.06.053en_AU
dc.identifier.govdoc1116en_AU
dc.identifier.issn0039-6028en_AU
dc.identifier.issue24en_AU
dc.identifier.journaltitleSurface Scienceen_AU
dc.identifier.pagination5744-5749en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/j.susc.2007.06.053en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/992en_AU
dc.identifier.volume601en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectPhysical vapor depositionen_AU
dc.subjectThin filmsen_AU
dc.subjectImagesen_AU
dc.subjectGrazingen_AU
dc.subjectWavelengthsen_AU
dc.subjectFar ultraviolet radiationen_AU
dc.subjectQuantum efficiencyen_AU
dc.subjectPhosphorsen_AU
dc.titleGrazing incidence x-ray studies of ultra-thin lumogen films.en_AU
dc.typeJournal Articleen_AU
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