Characterisation of alkyl-functionalised Si(111) using reflectometry and AC impedance spectroscopy

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dc.contributor.authorWong, ELSen_AU
dc.contributor.authorJames, Men_AU
dc.contributor.authorChilcott, TCen_AU
dc.contributor.authorCoster, HGLen_AU
dc.date.accessioned2008-02-13T04:10:06Zen_AU
dc.date.accessioned2010-04-30T05:01:51Zen_AU
dc.date.available2008-02-13T04:10:06Zen_AU
dc.date.available2010-04-30T05:01:51Zen_AU
dc.date.issued2007-12-15en_AU
dc.date.statistics2007-12en_AU
dc.description.abstractThe past few years have seen a dramatic increase in the study of organic thin-film systems that are based on silicon–carbon covalent bonds for bio-passivation or bio-sensing applications. This approach to functionalizing Si wafers is in contrast to gold-thiol or siloxane chemistries and has been shown to lead to densely packed alkyl monolayers. In this study, a series of alkyl monolayers [CH³(CH²)nCH=CH²; n=7, 9, 11, 13, 15] were directly covalent-linked to Si(111) wafers. The structures of these monolayers were studied using X-ray reflectometry (XRR) and AC impedance spectroscopy. Both techniques are sensitive to the variation in thickness with each addition of a CH2 unit and thus provide a useful means for monitoring molecular-scale events. The combination of these techniques is able to probe not only the thickness, but also the interfacial roughness and capacitance of the layer at the immobilized surface with atomic resolution. Fundamental physical properties of these films such as chain canting angles were also determined. © 2007, Elsevier Ltd.en_AU
dc.identifier.citationWong, E. L. S., James, M., Chilcott, T. C., & Coster, H. G. L. (2007). Characterisation of alkyl-functionalised Si(111) using reflectometry and AC impedance spectroscopy. Surface Science, 601, 5740-5743. doi:10.1016/j.susc.2007.06.067en_AU
dc.identifier.govdoc1110en_AU
dc.identifier.issn0039-6028en_AU
dc.identifier.journaltitleSurface Scienceen_AU
dc.identifier.pagination5740-5743en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/j.susc.2007.06.067en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/990en_AU
dc.identifier.volume601en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectMicroscopyen_AU
dc.subjectSpectroscopyen_AU
dc.subjectThin filmsen_AU
dc.subjectDiffractionen_AU
dc.subjectWettabilityen_AU
dc.subjectSiliconen_AU
dc.subjectCarbonen_AU
dc.subjectResolutionen_AU
dc.titleCharacterisation of alkyl-functionalised Si(111) using reflectometry and AC impedance spectroscopyen_AU
dc.typeJournal Articleen_AU
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