ANSTO heavy ion ToF for analysis of light elements in thin films

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dc.contributor.authorIonescu, Men_AU
dc.contributor.authorZhao, Yen_AU
dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorCohen, DDen_AU
dc.contributor.authorLynch, Den_AU
dc.contributor.authorGarton, DBen_AU
dc.contributor.authorStelcer, Een_AU
dc.contributor.authorPrior, MJen_AU
dc.date.accessioned2009-12-03T05:59:53Zen_AU
dc.date.accessioned2010-04-30T04:56:38Zen_AU
dc.date.available2009-12-03T05:59:53Zen_AU
dc.date.available2010-04-30T04:56:38Zen_AU
dc.date.issued2007-11en_AU
dc.date.statistics2007-11en_AU
dc.description.abstractThin films have various potential applications in electronic devices, and their performance is intricately linked with the electric and magnetic properties of the film, in which an important role is played by the presence of light elements, in particular Hydrogen, Oxygen and Nitrogen. The source of light elements, the form in which they are incorporated into the thin film, and how this is influencing the MgB2 thin film properties is currently under scrutiny by various research groups. Typically these films are grown on oxide ceramic substrates, such as Al2O3-C and it is possible that the source of Oxygen is the substrate itself or the growth atmosphere. Here we report on a study of light elements in MgB2 thin films grown on various substrates, using heavy ions recoil and a time-of-flight detector. A series of MgB2 thin film samples produced by PLD (pulsed laser deposition) were analyzed, including films produced in-situ on Al2O3-C substrates with an on-axis and off-axis geometry, one film produced in-situ with an off-axis geometry, and one film produced ex-situ, with a bulk-like Tc. We also analyzed one film produced with on-axis geometry under the same conditions on Si (001) substrate. The amount of Oxygen detected by ToF, appears to be correlated with the Tc of the films, the higher the Tc the lower the oxygen content. Also, the superconducting properties of the examined thin films are discussed in the context of the results.en_AU
dc.description.sponsorshipAustralian Institute of Nuclear Science and Engineering (AINSE); Vacuum Society of Australia (VSA); Australian Research Council (ARC); Australian Research Network for Advanced Materials (ARNAM); JAVAC; Nanotechnology Network; ThermoFisher Scientificen_AU
dc.identifier.citationIonescu, M., Zhao, Y., Siegele, R., Cohen, D. D., & Lynch, D., Garton, D., Stelcer, E., & Prior, M. (2007). ANSTO heavy ion ToF for analysis of light elements in thin films. Poster presented to the 15th Australian Conference on Nuclear and Complementary Techniques of Analysis and 9th Vacuum Society of Australia Congress, 21st – 23rd November 2007. Melbourne, Australia: University of Melbourne.en_AU
dc.identifier.conferenceenddate23 November 2007en_AU
dc.identifier.conferencename15th Australian Conference on Nuclear and Complementary Techniques of Analysis and 9th Vacuum Society of Australia Congressen_AU
dc.identifier.conferenceplaceMelbourne, Australiaen_AU
dc.identifier.conferencestartdate21 November 2007en_AU
dc.identifier.govdoc1015en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/2550en_AU
dc.language.isoenen_AU
dc.publisherAustralian Institute of Nuclear Science and Engineering (AINSE)en_AU
dc.subjectThin filmsen_AU
dc.subjectHeavy ionsen_AU
dc.subjectANSTOen_AU
dc.subjectVisible radiationen_AU
dc.subjectMagnetic propertiesen_AU
dc.subjectOxygenen_AU
dc.titleANSTO heavy ion ToF for analysis of light elements in thin filmsen_AU
dc.typeConference posteren_AU
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