Calibration of a JSEM-200 electron microscope

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dc.contributor.authorBlake, RGen_AU
dc.contributor.authorJostsons, Aen_AU
dc.contributor.authorKelly, PMen_AU
dc.date.accessioned2007-11-22T04:25:36Zen_AU
dc.date.accessioned2010-04-30T04:36:51Zen_AU
dc.date.available2007-11-22T04:25:36Zen_AU
dc.date.available2010-04-30T04:36:51Zen_AU
dc.date.issued1975-10en_AU
dc.description.abstractThe results of a detailed calibration of a JSEM-200 scanning transmission electron microscope are reported. Two types of measurements have been made: (a) calibration of the various parameters associated with scanning transmission (STEM) imaging, and (b) calibration of the usual parameters required for analytical diffraction contrast experiments in the conventional transmission mode (CTEM). The report also contains a detailed discussion of the various STEM imaging modes and the microscope settings necessary to obtain the required image.en_AU
dc.identifier.citationBlake, R. G, Jostsons, A., & Kelly, P. M. (1980). Calibration of a jsem-200 electron microscope with a magnetic specimen pole-piece (AAEC/E491). Lucas Heights, N.S.W.: Australian Atomic Energy Commission Research Establishment.en_AU
dc.identifier.govdoc580en_AU
dc.identifier.isbn0642997160en_AU
dc.identifier.otherAAEC-E-363en_AU
dc.identifier.placeofpublicationLucas Heights, New South Walesen_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/570en_AU
dc.language.isoen_auen_AU
dc.publisherAustralian Atomic Energy Commissionen_AU
dc.subjectCalibrationen_AU
dc.subjectElectron diffractionen_AU
dc.subjectElectron microscopesen_AU
dc.subjectImagesen_AU
dc.subjectLensesen_AU
dc.titleCalibration of a JSEM-200 electron microscopeen_AU
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