Transient capacitance measurements of deep level defects introduced in y-ray compensated germanium by long-term annealing at room temperature
dc.contributor.author | Pearton, SJ | en_AU |
dc.contributor.author | Williams, AA | en_AU |
dc.contributor.author | Tavendale, AJ | en_AU |
dc.contributor.author | Lawson, EM | en_AU |
dc.date.accessioned | 2007-11-22T04:19:05Z | en_AU |
dc.date.accessioned | 2010-04-30T04:33:26Z | en_AU |
dc.date.available | 2007-11-22T04:19:05Z | en_AU |
dc.date.available | 2010-04-30T04:33:26Z | en_AU |
dc.date.issued | 1980-09 | en_AU |
dc.description.abstract | Deep level transient spectroscopy (DLTS) has been applied to defect centres in γ-ray compensated germanium that has been subjected to long-term annealing at room temperature. Deep donor levels (Ec - 0.36 eV Ec - 0.20 eV) have been observed for the first time; annealing at 675ºC for 3 hours increased their concentration in proportion to the free carrier density indicating stable defect-impurity complexes. Recently irradiated samples from the original material have not shown these levels. The results support Russian work on the compensation mechanism - the formation of electically inactive vacancy-donor complexes. | en_AU |
dc.identifier.citation | Pearton, S. J., Williams, A. A., Tavendale, A. J., & Lawson, E. M. (1980). Transient capacitance measurements of deep level defects introduced in Y-ray compensated germanium by long-term annealing at room temperature (ANSTO/E-501). Lucas Heights, NSW: Australian Atomic Energy Commission, Research Establishment. | en_AU |
dc.identifier.govdoc | 393 | en_AU |
dc.identifier.isbn | 0642596980 | en_AU |
dc.identifier.isbn | 0642596980 | en_AU |
dc.identifier.other | AAEC-E-501 | en_AU |
dc.identifier.uri | http://apo.ansto.gov.au/dspace/handle/10238/314 | en_AU |
dc.language.iso | en_au | en_AU |
dc.publisher | Australian Atomic Energy Commission | en_AU |
dc.subject | Emission spectroscopy | en_AU |
dc.subject | Semiconductor materials | en_AU |
dc.subject | Germanium | en_AU |
dc.subject | Radiation effects | en_AU |
dc.subject | Gamma radiation | en_AU |
dc.subject | Annealing | en_AU |
dc.title | Transient capacitance measurements of deep level defects introduced in y-ray compensated germanium by long-term annealing at room temperature | en_AU |
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