Tandem probe analysis mode for synchrotron XFM: doubling throughput capacity

Simple item page
dc.contributor.authorDoolette, CLen_AU
dc.contributor.authorHoward, DLen_AU
dc.contributor.authorAfshar, Nen_AU
dc.contributor.authorKewish, CMen_AU
dc.contributor.authorPaterson, DJen_AU
dc.contributor.authorHuang, Jen_AU
dc.contributor.authorWagner, Sen_AU
dc.contributor.authorSantner, Jen_AU
dc.contributor.authorWenzel, WWen_AU
dc.contributor.authorRaimondo, Ten_AU
dc.contributor.authorDe Vries Van Leeuwen, ATen_AU
dc.contributor.authorHou, Len_AU
dc.contributor.authorvan der Bom, Fen_AU
dc.contributor.authorWeng, Hen_AU
dc.contributor.authorKopittke, PMen_AU
dc.contributor.authorLombi, Een_AU
dc.date.accessioned2024-11-18T01:04:55Zen_AU
dc.date.available2024-11-18T01:04:55Zen_AU
dc.date.issued2022-03-22en_AU
dc.date.statistics2024-11-14en_AU
dc.description.abstractSynchrotron-based X-ray fluorescence microscopy (XFM) analysis is a powerful technique that can be used to visualize elemental distributions across a broad range of sample types. Compared to conventional mapping techniques such as laser ablation inductively coupled plasma mass spectrometry or benchtop XFM, synchrotron-based XFM provides faster and more sensitive analyses. However, access to synchrotron XFM beamlines is highly competitive, and as a result, these beamlines are often oversubscribed. Therefore, XFM experiments that require many large samples to be scanned can penalize beamline throughput. Our study was largely driven by the need to scan large gels (170 cm2) using XFM without decreasing beamline throughput. We describe a novel approach for acquiring two sets of XFM data using two fluorescence detectors in tandem; essentially performing two separate experiments simultaneously. We measured the effects of tandem scanning on beam quality by analyzing a range of contrasting samples downstream while simultaneously scanning different gel materials upstream. The upstream gels were thin (<200 μm) diffusive gradients in thin-film (DGT) binding gels. DGTs are passive samplers that are deployed in water, soil, and sediment to measure the concentration and distribution of potentially bioavailable nutrients and contaminants. When deployed on soil, DGTs are typically small (2.5 cm2), so we developed large DGTs (170 cm2), which can be used to provide extensive maps to visualize the diffusion of fertilizers in soil. Of the DGT gel materials tested (bis-acrylamide, polyacrylamide, and polyurethane), polyurethane gels were most suitable for XFM analysis, having favorable handling, drying, and analytical properties. This gel type enabled quantitative (>99%) transmittance with minimal (<3%) flux variation during raster scanning, whereas the other gels had a substantial effect on the beam focus. For the first time, we have (1) used XFM for mapping analytes in large DGTs and (2) developed a tandem probe analysis mode for synchrotron-based XFM, effectively doubling throughput. The novel tandem probe analysis mode described here is of broad applicability across many XFM beamlines as it could be used for future experiments where any uniform, highly transmissive sample could be analyzed upstream in the "background"of downstream samples. © 2022 The Authors. Published by American Chemical Society.en_AU
dc.format.mediumPrint-Electronicen_AU
dc.identifier.citationDoolette, C. L., Howard, D. L., Afshar, N., Kewish, C. M., Paterson, D. J., Huang, J., Wagner, S., Santner, J., Wenzel, W. W., Raimondo, T., De Vries Van Leeuwen, A. T., Hou, L., van der Bom, F., Weng, H., Kopittke, P. M., & Lombi, E. (2022). Tandem probe analysis mode for synchrotron XFM: doubling throughput capacity. Analytical Chemistry, 94(11), 4584-4593. doi.org/10.1021/acs.analchem.1c04255en_AU
dc.identifier.issn0003-2700en_AU
dc.identifier.issn1520-6882en_AU
dc.identifier.issue11en_AU
dc.identifier.journaltitleAnalytical Chemistryen_AU
dc.identifier.pagination4584-4593en_AU
dc.identifier.urihttps://doi.org/10.1021/acs.analchem.1c04255en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15765en_AU
dc.identifier.volume94en_AU
dc.languageEnglishen_AU
dc.language.isoenen_AU
dc.publisherAmerican Chemical Society (ACS)en_AU
dc.subjectSynchrotronsen_AU
dc.subjectCapacityen_AU
dc.subjectMineralsen_AU
dc.subjectOrganic polymersen_AU
dc.subjectSoilsen_AU
dc.subjectProbesen_AU
dc.subjectLayersen_AU
dc.subjectBeamsen_AU
dc.subjectX-ray fluorescence analysisen_AU
dc.subjectMass spectrometersen_AU
dc.titleTandem probe analysis mode for synchrotron XFM: doubling throughput capacityen_AU
dc.typeJournal Articleen_AU
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Tandem Probe Analysis Mode for Synchrotron XFM Doubling Throughput Capacity.pdf
Size:
8.88 MB
Format:
Adobe Portable Document Format
Description:
Published version
Download
License bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
license.txt
Size:
1.66 KB
Format:
Plain Text
Description:
Download
Collections
Journal Articles