Focusing monochromator and imaging-plate camera for grazing-incidence diffraction studies of thin films
dc.contributor.author | Foran, GJ | en_AU |
dc.contributor.author | Garrett, RF | en_AU |
dc.contributor.author | Gentle, IR | en_AU |
dc.contributor.author | Creagh, DC | en_AU |
dc.contributor.author | Peng, JB | en_AU |
dc.contributor.author | Barnes, GT | en_AU |
dc.date.accessioned | 2024-04-08T02:14:08Z | en_AU |
dc.date.available | 2024-04-08T02:14:08Z | en_AU |
dc.date.issued | 1997-08-04 | en_AU |
dc.date.statistics | 2024-04-08 | en_AU |
dc.description | Physical copy held at as Proceedings at DDC: 539.735/19. Also published in Journal of Synchrotron Radiation, 5(3), 500-502. https://doi.org/doi:10.1107/S0909049597017287 | en_AU |
dc.description.abstract | A multiple-imaging-plate detector system and focusing monochromator have been developed and successfully applied to the time-resolved study of phase transitions in Langmuir–Blodgett films by grazing-incidence X-ray diffraction (GIXD). The monochromator described here combines fixed-exit-beam height with sagittal focusing of the second crystal. The design is similar to that of Matsushita et al. [Matsushita, Ishikawa & Oyanagi (1986). Nucl. Instrum. Methods, A246, 377–379], with the exception that the motion of the first crystal is achieved via a computer-controlled X-Y translation table rather than a set of cams. The second crystal is a ribbed Si(111) wafer mounted in a four-point bending mechanism. The first reported application of imaging plates to a GIXD study was carried out by our group and proved to be very successful in the determination of thin-film structure [Foran, Peng, Steitz, Barnes & Gentle (1996)[Foran, G. J., Peng, J. B., Steitz, R., Barnes, G. T. & Gentle, I. R. (1996). Langmuir, 12, 774-777.]. Langmuir, 12, 774–777]. To extend the capabilities of this system, an imaging-plate camera was designed and built which can accommodate up to 13 imaging plates (40 × 20 cm) inside the vacuum chamber of the main diffractometer at the Australian Beamline at the Photon Factory. © International Union of Crystallography | en_AU |
dc.identifier.booktitle | Proceedings of the 6th International Conference on Synchrotron Radiation Instrumentation, SRI'97, Himeji, Japan, 4-8 August 1997 | en_AU |
dc.identifier.citation | Foran, G. J., Garrett, R. F., Gentle, I. R., Creagh, D. C., Peng, J. B., & Barnes, G. T. (1998). Focusing monochromator and imaging-plate camera for grazing-incidence diffraction studies of thin films. Paper presented to the 6th International Conference on Synchrotron Radiation Instrumentation, SRI'97, Himeji, Japan, 4-8 August 1997. In Proceedings of the 6th International Conference on Synchrotron Radiation Instrumentation, SRI'97, Himeji, Japan, 4-8 August 1997, (pp. 500-502). | en_AU |
dc.identifier.conferenceenddate | 1997-08-08 | en_AU |
dc.identifier.conferencename | 6th International Conference on Synchrotron Radiation Instrumentation, SRI'97 | en_AU |
dc.identifier.conferenceplace | Himeji, Japan | en_AU |
dc.identifier.conferencestartdate | 1997-08-04 | en_AU |
dc.identifier.issue | 3 | en_AU |
dc.identifier.journaltitle | Journal of Synchrotron Radiation | en_AU |
dc.identifier.pagination | 500-502 | en_AU |
dc.identifier.placeofpublication | Great Britian | en_AU |
dc.identifier.uri | https://apo.ansto.gov.au/handle/10238/15549 | en_AU |
dc.identifier.volume | 5 | en_AU |
dc.language.iso | en | en_AU |
dc.publisher | International Union of Crystallography | en_AU |
dc.relation.uri | https://doi.org/10.1107/S0909049597017287 | en_AU |
dc.subject | Monochromators | en_AU |
dc.subject | Ionographic Imaging | en_AU |
dc.subject | Thin Films | en_AU |
dc.subject | Diffraction | en_AU |
dc.subject | Langmuir Probe | en_AU |
dc.subject | Crystals | en_AU |
dc.subject | Phase transformations | en_AU |
dc.title | Focusing monochromator and imaging-plate camera for grazing-incidence diffraction studies of thin films | en_AU |
dc.type | Conference Paper | en_AU |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.63 KB
- Format:
- Item-specific license agreed upon to submission
- Description: