Neutron reflectivity and atomic force microscopy studies on the effect of pH and solubilizate upon the structure of adsorbed cationic surfactant films on quartz

Simple item page
dc.contributor.authorSchulz, JCen_AU
dc.contributor.authorNelson, Aen_AU
dc.contributor.authorBlom, ACMen_AU
dc.contributor.authorWar, GGen_AU
dc.date.accessioned2022-08-16T01:14:08Zen_AU
dc.date.available2022-08-16T01:14:08Zen_AU
dc.date.issued2005-11-27en_AU
dc.date.statistics2022-05-13en_AU
dc.descriptionPhysical copy held by ANSTO Library at DDC 539.7217/2en_AU
dc.description.abstractWe have examined the adsorbed layer morphology of cationic surfactant, tetradecyltrimethylammonium bromide (TTAB), on the hydrophilic quartz surface using atomic force microscopy (AFM) and neutron reflectometry (NR). We report on the effect of varying the surface charge of quartz by adjusting the bulk solution pH upon the adsorbed surfactant film structure. AFM results show that number density of globular (or spherical) TTAB aggregates on quartz increases, as the pH of the bulk solution is increased, reflecting the increase in surface charge of quartz. NR results also verify the AFM observations. We also report on the effect of the incorporation of a non-adsorbing solubilisate, naphthol, into the adsorbed surfactant film. In the bulk solution the incorporation of naphthol molecules into surfactant micelles promotes in micellar growth. Similarly, in the adsorbed surfactant film a transition to from globular to cylindrical surfactant aggregates was also observed. © 2005 The Authorsen_AU
dc.identifier.booktitleFinal Programme and Abstract Booken_AU
dc.identifier.citationSchulz, J., Nelson, A., Blom, A., & War, G. (2005). Neutron reflectivity and atomic force microscopy studies on the effect of pH and solubilizate upon the structure of adsorbed cationic surfactant films on quartz. Paper presented at the Eighth International Conference on Neutron Scattering ICNS 2005, "Neutrons for structure and dynamics - a new era", Sydney Convention & Exhibition Centre, Sydney, Australia, 27 November-2 December 2005. In Final Programme and Abstract Book, (pp. 136-137).en_AU
dc.identifier.conferenceenddate2 December 2005en_AU
dc.identifier.conferencenameEighth International Conference on Neutron Scattering ICNS 2005: 'Neutrons for structure and dynamics - a new eraen_AU
dc.identifier.conferenceplaceSydney, Australiaen_AU
dc.identifier.conferencestartdate27 November 2005en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/13555en_AU
dc.language.isoenen_AU
dc.publisherThe Bragg Institute, Australian Nuclear Science and Technology Organisationen_AU
dc.subjectAdsorptionen_AU
dc.subjectAtomic force microscopyen_AU
dc.subjectCrystal structureen_AU
dc.subjectFilmsen_AU
dc.subjectLayersen_AU
dc.subjectMicellar systemsen_AU
dc.subjectNaphtholsen_AU
dc.subjectNeutron beamsen_AU
dc.subjectNeutron reflectorsen_AU
dc.subjectpH valueen_AU
dc.subjectQuartzen_AU
dc.subjectSorptive propertiesen_AU
dc.subjectSurfactantsen_AU
dc.titleNeutron reflectivity and atomic force microscopy studies on the effect of pH and solubilizate upon the structure of adsorbed cationic surfactant films on quartzen_AU
dc.typeConference Abstracten_AU
Files
License bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
license.txt
Size:
1.63 KB
Format:
Item-specific license agreed upon to submission
Description:
Download
Collections
Conference Publications