High-accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique

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dc.contributor.authorSier, Den_AU
dc.contributor.authorCousland, GPen_AU
dc.contributor.authorTrevorah, RMen_AU
dc.contributor.authorEkanayake, RSKen_AU
dc.contributor.authorTran, CQen_AU
dc.contributor.authorHester, JRen_AU
dc.contributor.authorChantler, CTen_AU
dc.date.accessioned2024-02-29T04:47:12Zen_AU
dc.date.available2024-02-29T04:47:12Zen_AU
dc.date.issued2021-08-14en_AU
dc.date.statistics2023-04-20en_AU
dc.description.abstractMeasurements of mass attenuation coefficients and X-ray absorption fine structure (XAFS) of zinc selenide (ZnSe) are reported to accuracies typically better than 0.13%. The high accuracy of the results presented here is due to our successful implementation of the X-ray Extended Range Technique (XERT), a relatively new methodology, which can be set up on most synchrotron X-ray beamlines. 561 attenuation coefficients were recorded in the energy range of 6.8 keV to 15 keV that was independently calibrated using powder diffractometry, with measurements concentrated at the zinc and selenium pre-edge, near edge and fine structure absorption edge regions. The removal of systematic effects as well as coherent (Thermal Diffuse) and incoherent (Compton) scattering processes produced very high accuracy values of photoelectrc attenuation which in turn yielded a detailed nanostructural analysis of room temperature ZnSe with full uncertainty propagation. Bond lengths, accurate to 0.003 Å to 0.009 Å, or 0.1% to 0.3%, are plausible and physical. Small variation from a crystalline structure suggests local dynamic motion beyond that of a standard crystal lattice, noting that XAFS is sensitive to dynamic correlated motion. The results obtained in this work are the most accurate to date with comparisons to theoretically determined values of the attenuation showing discrepancies from literature theory of up to 4%, motivating further investigation into the origin of such discrepancies. © The Authorsen_AU
dc.identifier.articlenumberC1271en_AU
dc.identifier.citationSier, D., Cousland, G. P., Trevorah, R. M., Ekanayake, R. S. K., Tran, C. Q., Hester, J. R., & Chantler, C. T. (2021). High-accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique. Poster presented to the IUCr 2021, 25th Congress of the International Union of Crystallography, 14-22 August 2021, Prague, Czech Republic. In Acta Crystallographica Section A: Foundations and Advances, 77(a2), C1271. doi:10.1107/S0108767321084439en_AU
dc.identifier.conferenceenddate2021-08-22en_AU
dc.identifier.conferencenameIUCr 2021, 25th Congress of the International Union of Crystallographyen_AU
dc.identifier.conferenceplacePrague, Czech Republicen_AU
dc.identifier.conferencestartdate2021-08-14en_AU
dc.identifier.issn2053-2733en_AU
dc.identifier.issuea2en_AU
dc.identifier.journaltitleActa Crystallographica Section A: Foundations and Advancesen_AU
dc.identifier.otherPS-55-5en_AU
dc.identifier.urihttps://doi.org/doi:10.1107/S0108767321084439en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15499en_AU
dc.identifier.volume77en_AU
dc.language.isoenen_AU
dc.publisherInternational Union of Crystallographyen_AU
dc.subjectFine structureen_AU
dc.subjectScatteringen_AU
dc.subjectCyrstal structureen_AU
dc.subjectZinc selenidesen_AU
dc.subjectDiffractionen_AU
dc.subjectAttenuationen_AU
dc.titleHigh-accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range techniqueen_AU
dc.typeConference Posteren_AU
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