Effect of tellurium (Te4+) irradiation on microstructure and associated irradiation-induced hardening

dc.contributor.authorHuang, HFen_AU
dc.contributor.authorLiao, JZen_AU
dc.contributor.authorLei, GHen_AU
dc.contributor.authorMuránsky, Oen_AU
dc.contributor.authorWei, Ten_AU
dc.contributor.authorIonescu, Men_AU
dc.date.accessioned2023-04-20T06:50:51Zen_AU
dc.date.available2023-04-20T06:50:51Zen_AU
dc.date.issued2021-04en_AU
dc.date.statistics2023-01-19en_AU
dc.description.abstractThe GH3535 alloy samples were irradiated using 15-MeV Te4+ ions at 650 °C to a dose of 0.5, 3.0, 10, and 20 dpa, respectively. The Te atoms distribution and microstructure evolution were examined by electron probe microanalysis (EPMA) and transmission electron microscopy (TEM). The nano-indenter was then used to measure the nano-hardness changes of samples before and after irradiation. TEM results showed the formation of dislocation loops in the irradiated samples. Their mean diameters increase with the increase of irradiation dose and tends to be saturated when irradiation dose exceeds 10 dpa. The ratio of yield strength increments calculated by dispersed barrier hardening (DBH) model is basically consistent with that of nano-hardness increments measured by nano-indenter. In addition, the relationship between the nano-hardness increments and dpa for the GH3535 alloy irradiated by Te ions has been revealed in the study. © 2021 Chinese Physical Society and IOP Publishing Ltden_AU
dc.identifier.articlenumber56108en_AU
dc.identifier.citationHuang, H., Liu, J., Lei, G., Muránsky, O., Wei, T., & Ionescu, M. (2021). Effect of tellurium (Te4+) irradiation on microstructure and associated irradiation-induced hardening. Chinese Physics B, 30(5), 056108. doi:10.1088/1674-1056/abf039en_AU
dc.identifier.issn1674-1056en_AU
dc.identifier.issue5en_AU
dc.identifier.journaltitleChinese Physics Ben_AU
dc.identifier.urihttps://doi.org/10.1088/1674-1056/abf039en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/14913en_AU
dc.identifier.volume30en_AU
dc.language.isoenen_AU
dc.publisherIOP Publishingen_AU
dc.subjectTelluriumen_AU
dc.subjectIrradiationen_AU
dc.subjectMicrostructureen_AU
dc.subjectHardeningen_AU
dc.subjectTransmission electron microscopyen_AU
dc.subjectElectron microprobe analysisen_AU
dc.titleEffect of tellurium (Te4+) irradiation on microstructure and associated irradiation-induced hardeningen_AU
dc.typeJournal Articleen_AU
Files
License bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
1.63 KB
Format:
Item-specific license agreed upon to submission
Description:
Collections