Three-dimensional phase imaging with near infrared synchrotron beam using phase-retrieval algorithm

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dc.contributor.authorHan, Men_AU
dc.contributor.authorSmith, Den_AU
dc.contributor.authorNg, SHen_AU
dc.contributor.authorKatkus, TAen_AU
dc.contributor.authorSimon, Aen_AU
dc.contributor.authorRajeswary, JFen_AU
dc.contributor.authorPraveen, PAen_AU
dc.contributor.authorTobin, MJen_AU
dc.contributor.authorVongsvivut, JPen_AU
dc.contributor.authorJuodkazis, Sen_AU
dc.contributor.authorAnand, Ven_AU
dc.date.accessioned2024-04-02T06:21:38Zen_AU
dc.date.available2024-04-02T06:21:38Zen_AU
dc.date.issued2023-03-08en_AU
dc.date.statistics2023-06-06en_AU
dc.description.abstractThe near infrared (NIR) part of the infrared synchrotron beam is usually dumped to improve the signal to noise ratio of spectral imaging. In this study, this NIR synchrotron beam has been extracted and used for three-dimensional (3D) phase imaging. A pinhole was inserted in the path of the fork shaped NIR synchrotron beam and the Airy diffraction pattern was aligned with biochemical samples and the diffracted intensity distribution was captured using an image sensor sensitive to NIR. A phase retrieval algorithm was used to estimate the 3D phase distribution at the object plane from the recorded intensity distribution. © (2023) Society of Photo-Optical Instrumentation Engineers (SPIE)en_AU
dc.identifier.booktitleProceedings of SPIEen_AU
dc.identifier.citationHan, M., Smith, D., Ng, S. H., Katkus, T., John Francis Rajeswary, A. S., Praveen, P. A., Tobin, M., Vongsvivut, J., Juodkazis, S., & Anand, V. (2023). Three-dimensional phase imaging with near infrared synchrotron beam using phase-retrieval algorithm. Paper presented to Practical Holography XXXII: Displays, Materials and Applications, 29-31 January 2018, San Francisco, California, United States. In Pierre-Alexandre J. Blanche, Seung-Hyun Lee (eds), Proceedings of SPIE Vol. 12445. doi:10.1117/12.2654911en_AU
dc.identifier.conferenceenddate2018-01-31en_AU
dc.identifier.conferencenamePractical Holography XXXII: Displays, Materials and Applicationsen_AU
dc.identifier.conferenceplaceSan Francisco, Californiaen_AU
dc.identifier.conferencestartdate2018-01-29en_AU
dc.identifier.editorsPierre-Alexandre J. Blanche, Seung-Hyun Leeen_AU
dc.identifier.isbn9781510659957en_AU
dc.identifier.isbn978151065996en_AU
dc.identifier.issn0277-786Xen_AU
dc.identifier.issn1996-756Xen_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15543en_AU
dc.identifier.volume12445en_AU
dc.language.isoenen_AU
dc.publisherSociety of Photo-Optical Instrumentation Engineers (SPIE)en_AU
dc.relation.urihttps://doi.org/10.1117/12.2654911en_AU
dc.subjectBeamsen_AU
dc.subjectAlgorithmsen_AU
dc.subjectSynchrotronsen_AU
dc.subjectNear infrared radiationen_AU
dc.subjectDiffractionen_AU
dc.subjectSchwarzschild Metricen_AU
dc.subjectAlignmenten_AU
dc.titleThree-dimensional phase imaging with near infrared synchrotron beam using phase-retrieval algorithmen_AU
dc.typeConference Presentationen_AU
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