Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector

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dc.contributor.authorKirkwood, HJen_AU
dc.contributor.authorde Jonge, MDen_AU
dc.contributor.authorMuránsky, Oen_AU
dc.contributor.authorHofmann, Fen_AU
dc.contributor.authorHoward, DLen_AU
dc.contributor.authorRyan, CGen_AU
dc.contributor.authorvan Riessen, GAen_AU
dc.contributor.authorRowles, MRen_AU
dc.contributor.authorParadowska, AMen_AU
dc.contributor.authorAbbey, Ben_AU
dc.date.accessioned2021-02-11T03:39:13Zen_AU
dc.date.available2021-02-11T03:39:13Zen_AU
dc.date.issued2018-02-01en_AU
dc.date.statistics2021-02-09en_AU
dc.description.abstractInteractions between neighboring grains influence the macroscale behavior of polycrystalline materials, particularly their deformation behavior, damage initiation and propagation mechanisms. However, mapping all of the critical material properties normally requires that several independent measurements are performed. Here we report the first grain mapping of a polycrystalline foil using a pixelated energy-dispersive X-ray area detector, simultaneously measuring X-ray fluorescence and diffraction with the Maia detector in order to determine grain orientation and estimate lattice strain. These results demonstrate the potential of the next generation of X-ray area detectors for materials characterization. By scanning the incident X-ray energy we investigate these detectors as a complete solution for simultaneously mapping the crystallographic and chemical properties of the sample. The extension of these techniques to broadband X-ray sources is also discussed. © 2017 Acta Materialia Inc. Published by Elsevier Ltd.en_AU
dc.identifier.citationKirkwood, H. J., de Jonge, M. D., Muránsky, O., Hofmann, F., Howard, D. L., Ryan, C. G., van Riessen, G., Rowles, M. R., Paradowska, A. M., & Abbey, B. (2018). Simultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detector. Acta Materialia, 144, 1-10. doi:10.1016/j.actamat.2017.10.025en_AU
dc.identifier.issn1359-6454en_AU
dc.identifier.issue1-10en_AU
dc.identifier.journaltitleActa Materialiaen_AU
dc.identifier.pagination45200en_AU
dc.identifier.urihttps://doi.org/10.1016/j.actamat.2017.10.025en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/10380en_AU
dc.identifier.volume144en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectX-ray diffractionen_AU
dc.subjectFluorescenceen_AU
dc.subjectStrainsen_AU
dc.subjectOrientationen_AU
dc.subjectEnergyen_AU
dc.subjectPolycrystalsen_AU
dc.subjectDeformationen_AU
dc.titleSimultaneous X-ray diffraction, crystallography and fluorescence mapping using the Maia detectoren_AU
dc.typeJournal Articleen_AU
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