Advice on describing Bayesian analysis of neutron and x-ray reflectometry

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dc.contributor.authorMcCluskey, ARen_AU
dc.contributor.authorCaruana, AJen_AU
dc.contributor.authorKinane, CJen_AU
dc.contributor.authorArmstrong, AJen_AU
dc.contributor.authorArnold, Ten_AU
dc.contributor.authorCooper, JFKen_AU
dc.contributor.authorCortie, DLen_AU
dc.contributor.authorHughes, AVen_AU
dc.contributor.authorMoulin, JFen_AU
dc.contributor.authorNelson, ARJen_AU
dc.contributor.authorPotrzebowski, Wen_AU
dc.contributor.authorStarostin, Ven_AU
dc.date.accessioned2024-08-22T01:46:02Zen_AU
dc.date.available2024-08-22T01:46:02Zen_AU
dc.date.issued2023-02-01en_AU
dc.date.statistics2024-05-28en_AU
dc.description.abstractAs a result of the availability of modern software and hardware, Bayesian analysis is becoming more popular in neutron and X-ray reflectometry analysis. The understandability and replicability of these analyses may be harmed by inconsistencies in how the probability distributions central to Bayesian methods are represented in the literature. Herein advice is provided on how to report the results of Bayesian analysis as applied to neutron and X-ray reflectometry. This includes the clear reporting of initial starting conditions, the prior probabilities, the results of any analysis and the posterior probabilities that are the Bayesian equivalent of the error bar, to enable replicability and improve understanding. It is believed that this advice, grounded in the authors' experience working in the field, will enable greater analytical reproducibility in the work of the reflectometry community, and improve the quality and usability of results. © The Authors CC BY 4.0en_AU
dc.format.mediumElectronic-eCollectionen_AU
dc.identifier.citationMcCluskey, A. R., Caruana, A. J., Kinane, C. J., Armstrong, A. J., Arnold, T., Cooper, J. F. K., Cortie, D. L., Hughes, A. V., Moulin, J.-F., Nelson, A. R. J., Potrzebowski, W., & Starostin, V. (2023). Advice on describing Bayesian analysis of neutron and X-ray reflectometry. Journal of Applied Crystallography, 56(1), 12-17. doi:10.1107/S1600576722011426en_AU
dc.identifier.issn0021-8898en_AU
dc.identifier.issn1600-5767en_AU
dc.identifier.issue1en_AU
dc.identifier.journaltitleJournal of Applied Crystallographyen_AU
dc.identifier.pagination12-17en_AU
dc.identifier.urihttps://doi.org/10.1107/s1600576722011426en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15655en_AU
dc.identifier.volume56en_AU
dc.languageengen_AU
dc.language.isoenen_AU
dc.publisherInternational Union of Crystallographyen_AU
dc.subjectReflectivityen_AU
dc.subjectBayesian statisticsen_AU
dc.subjectDataen_AU
dc.subjectNeutron reflectorsen_AU
dc.subjectAlgorithmsen_AU
dc.subjectDistributionen_AU
dc.subjectProbabilityen_AU
dc.titleAdvice on describing Bayesian analysis of neutron and x-ray reflectometryen_AU
dc.typeJournal Articleen_AU
dcterms.dateAccepted2022-11-28en_AU
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