The effect of single crystalline substrates and ion-beam bombardment on exchange bias in nanocrystalline NiO/Ni80Fe20 bilayers

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dc.contributor.authorCortie, DLen_AU
dc.contributor.authorShueh, Cen_AU
dc.contributor.authorLai, BCen_AU
dc.contributor.authorPong, PWTen_AU
dc.contributor.authorvan Lierop, Jen_AU
dc.contributor.authorKlose, Fen_AU
dc.contributor.authorLin, KWen_AU
dc.date.accessioned2024-01-11T21:58:34Zen_AU
dc.date.available2024-01-11T21:58:34Zen_AU
dc.date.issued2013-12-23en_AU
dc.date.statistics2023-10-25en_AU
dc.description.abstractMethods to modify the magnetic coercivity and exchange bias field of nanocrystalline antiferromagnetic/ferromagnetic NiO/Ni 80 Fe 20 thin films were investigated for bilayers grown using ion-assisted deposition onto different single crystalline substrates. An enhanced coercivity was found at 298 K for the films deposited on single crystalline MgO (100) and Al 2 O 3 (11-20) substrates. After field cooling the films to 50 K, the NiO/NiFe bilayer grown on Al 2 O 3 (11-20) exhibited the largest exchange bias ( - 25 Oe). The second part of the study investigated ion-beam modification of the ferromagnetic surface prior to the deposition of the NiO layer. A range of ion-beam bombardment energies (V EH ) were used to modify in situ the NiFe surface during the deposition of NiO/NiFe/SiO 2 films. Cross-sectional transmission electron microscopy showed a systematic reduction in the thickness of the NiFe layers with increasing Ar + bombardment energies attributed to etching of the surface. In addition, the bombardment procedure modified the magnetic exchange bias of the composite structure in both the as-prepared and field-cooled state. © 2013 IEEEen_AU
dc.description.sponsorshipThis work was supported by the NSC of Taiwan and NSERC of Canada. The work of D. Cortie was supported by the Australian Institute of Nuclear Science and Engineering.en_AU
dc.identifier.articlenumber2300904en_AU
dc.identifier.citationCortie, D. L., Shueh, C., Lai, B.-C., Pong, P. W. T., van Lierop, J., Klose, F., & Lin, K.-W. (2013). The effect of single crystalline substrates and ion-beam bombardment on exchange bias in nanocrystalline NiO/Ni80Fe20 bilayers. IEEE transactions on magnetics, 50(1), 1-4. doi:10.1109/TMAG.2013.2274654en_AU
dc.identifier.issn0018-9464en_AU
dc.identifier.issue1en_AU
dc.identifier.journaltitleIEEE transactions on magneticsen_AU
dc.identifier.pagination1-4en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15330en_AU
dc.identifier.volume50en_AU
dc.language.isoenen_AU
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_AU
dc.relation.urihttps://doi.org/10.1109/TMAG.2013.2274654en_AU
dc.subjectSubstratesen_AU
dc.subjectHysteresisen_AU
dc.subjectSurface treatmentsen_AU
dc.subjectCoolingen_AU
dc.subjectNickelen_AU
dc.subjectIronen_AU
dc.subjectIon beamsen_AU
dc.subjectThin Filmsen_AU
dc.subjectLayersen_AU
dc.titleThe effect of single crystalline substrates and ion-beam bombardment on exchange bias in nanocrystalline NiO/Ni80Fe20 bilayersen_AU
dc.typeJournal Articleen_AU
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