Estimating dielectric parameters by reflecting evanescent waves at THz frequencies

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dc.contributor.authorVilagosh, Zen_AU
dc.contributor.authorForoughimehr, Nen_AU
dc.contributor.authorLajevardipour, Aen_AU
dc.contributor.authorAppadoo, Den_AU
dc.contributor.authorJuodkazis, Sen_AU
dc.contributor.authorWood, AWen_AU
dc.date.accessioned2024-04-12T05:07:15Zen_AU
dc.date.available2024-04-12T05:07:15Zen_AU
dc.date.issued2021-04-20en_AU
dc.date.statistics2023-04-28en_AU
dc.description.abstractThe THz/Far-IR Beamline at the Australian Synchrotron was used to demonstrate a novel method of estimating the dielectric properties of homogenous substances in the 1.0 THz to 4.0 THz region. Attenuated total reflection (ATR) coupled with synchrotron sources allow rapid evaluation of samples. The source is incoherent, thus normally only reflectance can be derived, as phase shift data cannot be obtained with this arrangement. A method is presented of deriving the full complex dielectric parameters by a modified frustrated internal reflection technique which reflects the evanescent wave using a gold plated mirror. Oil and alcohol samples were used in the study. With the mirror in situ, the reflectance changed from being enhanced at some frequencies to undergoing a frequency dependent destructive interference at other frequencies. The change in different samples was noted to vary according to the refractive index (but not the absorption coefficient) of the sample. © (2022) Society of Photo-Optical Instrumentation Engineers (SPIE)en_AU
dc.identifier.citationVilagosh, Z., Foroughimehr, N., Lajevardipour, A., Appadoo, D., Juodkazis, S., & Wood, A. (2021). Estimating dielectric parameters by reflecting evanescent waves at THz frequencies. Paper presented to Biomedical Imaging and Sensing Conference 2021, 20-22 April 2021, Online. In Yatagai, T. (ed). Proceedings Volume 12000, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV; 120000L (2022). doi:10.1117/12.2609533en_AU
dc.identifier.conferenceenddate2021-04-22en_AU
dc.identifier.conferencenameBiomedical Imaging and Sensing Conference 2021en_AU
dc.identifier.conferenceplaceOnlineen_AU
dc.identifier.conferencestartdate2021-04-20en_AU
dc.identifier.isbn9781510647190en_AU
dc.identifier.urihttps://doi.org/10.1117/12.2609533en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15559en_AU
dc.identifier.volume12000en_AU
dc.language.isoenen_AU
dc.publisherSociety of Photo-Optical Instrumentation Engineers (SPIE)en_AU
dc.relation.ispartofseriesProceedings Volume Vol. 11840, Developments in X-Ray Tomography XIII;118400G. doi:10.1117/12.2597722;en_AU
dc.relation.urihttps://doi.org/10.1117/12.2609533en_AU
dc.subjectTHZ rangeen_AU
dc.subjectANSTOen_AU
dc.subjectAustralian organizationsen_AU
dc.subjectDielectric propertiesen_AU
dc.subjectSynchrotron radiation sourcesen_AU
dc.subjectFrequency dependenceen_AU
dc.subjectAbsorptionen_AU
dc.titleEstimating dielectric parameters by reflecting evanescent waves at THz frequenciesen_AU
dc.typeConference Paperen_AU
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