Depth-resolved measurement of the Meissner screening profile in a niobium thin film from spin-lattice relaxation of the implanted β-emitter 8Li

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dc.contributor.authorMcFadden, RMLen_AU
dc.contributor.authorAsaduzzaman, Men_AU
dc.contributor.authorBuck, TJen_AU
dc.contributor.authorCortie, DLen_AU
dc.contributor.authorDehn, MHen_AU
dc.contributor.authorDunsiger, SRen_AU
dc.contributor.authorKiefl, RFen_AU
dc.contributor.authorLaxdal, REen_AU
dc.contributor.authorLevy, CDPen_AU
dc.contributor.authorMacFarlane, WAen_AU
dc.contributor.authorMorris, GDen_AU
dc.contributor.authorPearson, MRen_AU
dc.contributor.authorThoeng, Een_AU
dc.contributor.authorJunginger, Ten_AU
dc.date.accessioned2025-01-09T05:10:12Zen_AU
dc.date.available2025-01-09T05:10:12Zen_AU
dc.date.issued2023-10-28en_AU
dc.date.statistics2024-05-21en_AU
dc.description.abstractWe report measurements of the Meissner screening profile in a Nb(300 nm)/Al2O3 thin film using 8Liβ-detected nuclear magnetic resonance (β-NMR). The NMR probe 8Li was ion-implanted into the Nb film at energies ≤ 20 keV, corresponding to mean stopping depths comparable to Nb’s magnetic penetration depth λ. 8Li’s strong dipole–dipole coupling with the host 93Nb nuclei provided a “cross-relaxation” channel that dominated in low magnetic fields, which conferred indirect sensitivity to the local magnetic field via the spin-lattice relaxation (SLR) rate 1/T1. From a fit of the 1/T1 data to a model accounting for its dependence on temperature, magnetic field, and 8Li+ implantation energy, we obtained a magnetic penetration depth λ0= 51.5(22) nm, consistent with a relatively short carrier mean-free-path ℓ= 18.7(29) nm typical of similarly prepared Nb films. The results presented here constitute an important step toward using 8Liβ-NMR to characterize bulk Nb samples with engineered surfaces, which are often used in the fabrication of particle accelerators. © © 2023 Author(s). Published under an exclusive license by AIP Publishing.en_AU
dc.identifier.articlenumber163902en_AU
dc.identifier.citationMcFadden, R. M. L., Asaduzzaman, M., Buck, T. J., Cortie, D. L., Dehn, M. H., Dunsiger, S. R., Kiefl, R. F., Laxdal, R. E., Levy, C. D. P., MacFarlane, W. A., Morris, G. D., Pearson, M. R., Thoeng, E., & Junginger, T. (2023). Depth-resolved measurement of the Meissner screening profile in a niobium thin film from spin-lattice relaxation of the implanted β-emitter 8Li. Journal of Applied Physics, 134(16), 163902. doi:10.1063/5.0175532en_AU
dc.identifier.issn0021-8979en_AU
dc.identifier.issn1089-7550en_AU
dc.identifier.issue16en_AU
dc.identifier.journaltitleJournal of Applied Physicsen_AU
dc.identifier.urihttps://doi.org/10.1063/5.0175532en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15870en_AU
dc.identifier.volume134en_AU
dc.languageEnglishen_AU
dc.language.isoenen_AU
dc.publisherAIP Publishingen_AU
dc.subjectNiobiumen_AU
dc.subjectThin Filmsen_AU
dc.subjectLithiumen_AU
dc.subjectSpin-lattice relaxationen_AU
dc.subjectElectromagnetic fieldsen_AU
dc.subjectDataen_AU
dc.subjectIon implantationen_AU
dc.subjectSuperconductivityen_AU
dc.subjectIon implantationen_AU
dc.subjectNuclear magnetic resonanceen_AU
dc.titleDepth-resolved measurement of the Meissner screening profile in a niobium thin film from spin-lattice relaxation of the implanted β-emitter 8Lien_AU
dc.typeJournal Articleen_AU
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