Powder diffraction using imaging plates at the Australian National Beamline Facility at the Photon Factory

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dc.contributor.authorGarrett, RFen_AU
dc.contributor.authorCookson, DJen_AU
dc.contributor.authorForan, GJen_AU
dc.contributor.authorSabine, TMen_AU
dc.contributor.authorKennedy, BJen_AU
dc.contributor.authorWilkins, SWen_AU
dc.date.accessioned2024-05-09T01:51:30Zen_AU
dc.date.available2024-05-09T01:51:30Zen_AU
dc.date.issued1994-07-18en_AU
dc.date.statistics2024-04-23en_AU
dc.descriptionPhysical copy held by ANSTO Library at DDC: 539.735/22. Also available online at: https://doi.org/10.1063/1.1145972. .en_AU
dc.description.abstractA novel x‐ray diffractometer was installed at the Australian National Beamline Facility at the Photon Factory, Japan, in October 1993. One of the major capabilities of the instrument is high speed high resolution powder diffraction using imaging plate detectors. The diffractometer combines a two circle goniometer and a large cassette in which imaging plates can be loaded covering 320° of 2θ. The diffractometer is enclosed in a large vacuum chamber and can be operated in air, vacuum, or helium. Recently, powder data has been obtained from rutile (TiO2) and NBS Si 640b at wavelengths from 0.62 to 1.9 Å using imaging plates, and has been used to characterize the performance of the instrument. The data has been refined using the Rietveld method and R values of under 2% obtained. The resolution of the system varies from a minimum of about 0.04° to around 0.25° at 2θ angles around 160°, which is the equal of most synchrotron based powder diffractometers, and only slightly worse than that obtained using an analyzer crystal and scintillation detector. Using the imaging plates, 160° of data is simultaneously acquired in an exposure of about 10 min, compared to conventional counter diffractometer scans which routinely exceed 10 hours. © 1995 American Institute of Physics.en_AU
dc.identifier.booktitleProceedings of the 5th International Conference on Synchrotron Radiation Instrumentation : Stony Brook, New York, 18-22 July 1994en_AU
dc.identifier.citationGarrett, R. F., Cookson, D. J., Foran, G. J., Sabine, T. M., Kennedy, B. J., & Wilkins, S. W. (1995). Powder diffraction using imaging plates at the Australian National Beamline Facility at the Photon Factory. Paper preseted to the 5th International Conference on Synchrotron Radiation Instrumentation, 18−22 Jul 1994, Stony Brook, New York (USA). In J. B. Hastings, S. L Hulbert,, & G. P Williams (eds), Proceedings of the 5th international conference on synchrotron radiation instrumentation, 18−22 Jul 1994, Stony Brook, New York (USA), Vol. 66(2), pp. 1351-1353.en_AU
dc.identifier.conferenceenddate1994-07-22en_AU
dc.identifier.conferencename5th international conference on synchrotron radiation instrumentationen_AU
dc.identifier.conferenceplaceStony Brook, New Yorken_AU
dc.identifier.conferencestartdate1994-07-18en_AU
dc.identifier.editorsHastings. J. B., Hulbert, S. L. Williams. G. P.en_AU
dc.identifier.isbn156396452Xen_AU
dc.identifier.issn1089-7623en_AU
dc.identifier.issn0034-6748en_AU
dc.identifier.issue2en_AU
dc.identifier.pagination1351-1353en_AU
dc.identifier.placeofpublicationUnited States of Americaen_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15596en_AU
dc.identifier.volume66en_AU
dc.language.isoenen_AU
dc.publisherAmerican Institute of Physicsen_AU
dc.relation.urihttps://doi.org/10.1063/1.1145972en_AU
dc.subjectDiffractionen_AU
dc.subjectMeasuring instrumentsen_AU
dc.subjectBeamsen_AU
dc.subjectAustralian organizationsen_AU
dc.subjectDataen_AU
dc.subjectSynchrotronsen_AU
dc.subjectWavelengthsen_AU
dc.titlePowder diffraction using imaging plates at the Australian National Beamline Facility at the Photon Factoryen_AU
dc.typeConference Paperen_AU
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