Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses

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dc.contributor.authorCohen, DDen_AU
dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorOrlic, Ien_AU
dc.contributor.authorStelcer, Een_AU
dc.date.accessioned2025-01-24T02:05:40Zen_AU
dc.date.available2025-01-24T02:05:40Zen_AU
dc.date.issued2002-04en_AU
dc.description.abstractThis paper describes PIXE/PIGE measurements on thin Micromatter Standard (±5%) foils run over a period of 10 years. The selected foils were typically 50 μg/cm2 thick and covered the commonly used PIXE X-ray energy range 1.4-20 keV and the light elements F and Na for PIGE studies. For the thousands of thick obsidian and pottery samples analysed over a 6-year period, the Ohio Red Clay standard has been used for both PIXE and PIGE calibration of a range of elements from Li to Rb. For PIXE, the long-term accuracy could be as low as ±1.6% for major elements with precision ranging from ±5% to ±10% depending on the elemental concentration. For PIGE, accuracies were around ±5% with precision ranging from ±5% in thick samples to ±15% in thin samples or for low yield γ-ray production. © 2002 Published by Elsevier Science B.V.en_AU
dc.identifier.booktitleParticle induced x-ray emission and its analytical applications : proceedings of the ninth International Conference on PIXE and its Analytical Applications, Guelph, Ontario, Canada, 8-12 June 2001en_AU
dc.identifier.citationCohen, D. D., Siegele, R., Orlic, I., & Stelcer, E. (2002). Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses. Paper presented to the 9th International Conference on PIXE and its Analytical Applications, Guelph, Ontario, Canada, 8-12 June 2001. In Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 189(1), 81-85. doi:10.1016/S0168-583X(01)01011-4en_AU
dc.identifier.conferenceenddate2001-06-12en_AU
dc.identifier.conferencename9th International Conference on PIXE and its Analytical Applicationsen_AU
dc.identifier.conferenceplaceGuelph, Ontario, Canadaen_AU
dc.identifier.conferencestartdate2001-06-08en_AU
dc.identifier.editorsJ. L. Campbellen_AU
dc.identifier.issn0168-583Xen_AU
dc.identifier.issue1-4en_AU
dc.identifier.journaltitleNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atomsen_AU
dc.identifier.pagination81-85en_AU
dc.identifier.placeofpublicationNew York, USAen_AU
dc.identifier.urihttps://doi.org/10.1016/s0168-583x(01)01011-4en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15957en_AU
dc.identifier.volume189en_AU
dc.languageEnglishen_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectPIXE analysisen_AU
dc.subjectAccuracyen_AU
dc.subjectAcceleratorsen_AU
dc.subjectVan De Graaff Acceleratorsen_AU
dc.subjectDataen_AU
dc.subjectTrace amountsen_AU
dc.subjectConcentration ratioen_AU
dc.subjectClaysen_AU
dc.subjectCalibration standardsen_AU
dc.titleLong-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analysesen_AU
dc.typeConference Paperen_AU
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