Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/5499
Title: High temperature diffraction studies of in-situ crystallization of nanostructured TiO2 photocatalysts
Other Titles: Nanostructured Materials and Nanotechnology V A Collection of Papers Presented at the 35th International Conference on Advanced Ceramics and Composites January 23-28, 2011 Daytona Beach, Florida
Authors: Low, IM
Curtain, B
Philipps, M
Liu, ZQ
Ionescu, M
Keywords: Temperature range 0400-1000 K
Diffraction
Nanostructures
Crystallization
Photocatalysis
Rutile
Issue Date: 1-Jan-2012
Publisher: The Ameican Ceramic Society
Citation: Low, I. M., Curtain, B., Philipps, M., Liu, Z. Q., & Ionescu, M. (2012). High temperature diffraction studies of in-situ crystallization of nanostructured TiO2 photocatalysts. In Nanostructured Materials and Nanotechnology V (eds S. Mathur, S.S. Ray, S. Widjaja and D. Singh) (Volume 32, pp.. 187-195). Hoboken, New Jersey: John Wiley & Sons, Inc. doi.org/10.1002/9781118095362.ch17
Abstract: The in-situ crystallization of anatase and rutile on chemically-treated Ti-foils in the temperature range 20-900 degrees C has been investigated using synchrotron radiation diffraction and x-ray diffraction. The processing methodology has a profound influence on the morphology, crystallite size and growth rate of nanostructured TiO2. The anatase formed was metastable and transformed to rutile at similar to 800 degrees C. Increasing the temperature from 400 to 900 degrees C caused the sharpening of anatase (101) peaks and resulted in a concomitant coarsening in crystallite size. The surface of annealed samples exhibited TiO2 nanorods, nanowires or nanotubes depending on the processing method. Ion-beam analysis has indicated the existence of composition gradation within the annealed TiO2 samples at the near-surface. © 2012, The American Ceramic Society.
Gov't Doc #: 4736
URI: http://dx.doi.org/10.1002/9781118095362.ch17
http://apo.ansto.gov.au/dspace/handle/10238/5499
ISBN: 9781118059920
ISSN: 0004-881X
Appears in Collections:Conference Publications

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