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dc.contributor.authorZhou, XL-
dc.contributor.authorHuang, HF-
dc.contributor.authorXie, R-
dc.contributor.authorThorogood, GJ-
dc.contributor.authorYang, C-
dc.contributor.authorLi, ZJ-
dc.contributor.authorXu, HJ-
dc.identifier.citationZhou, X. L., Huang, H. F., Xie, R., Thorogood, G. J., Yang, C., Li, Z. J., & Xu, H. J. (2015). Helium ion irradiation behavior of Ni-1wt.%SiCNP composite and the effect of ion flux. Journal of Nuclear Materials, 467, 848-854. doi:10.1016/j.jnucmat.2015.11.004en_US
dc.description.abstractSilicon carbide nanoparticle-reinforced nickel metal (Ni–SiCNP composite) samples were bombarded by helium ions with fluences of 1 × 1016 and 3 × 1016 ions/cm2 at two different fluxes. The microstructural and mechanical changes were characterized via TEM and nanoindentation. Nano-scaled helium bubbles in the shape of spheres were observed in the samples irradiated at high flux and polygons at low flux. The number of helium bubbles increased with the fluence, whereas their mean size remained unaffected. In addition, the nanohardness of the damage layer also increased as the fluence increased. In addition this study suggests that a higher flux results in a higher number of smaller helium bubbles, while showing no obvious effect on the irradiation-induced hardening of the materials. © 2015 Elsevier B.Ven_US
dc.description.sponsorshipThe authors gratefully acknowledge the financial support of the project from the China-Australia Joint Research Project (Grant No. 2014DFG60230), Knowledge Innovation Program of Chinese Academy of Sciences, Scientific Research Foundation for Returned Scholars, Ministry of Education of China and the “Strategic Priority Research Program” of the Chinese Academy of Sciences (Grant No. XDA02004210).en_US
dc.subjectNickel compoundsen_US
dc.subjectRadiation hardeningen_US
dc.subjectHelium ionsen_US
dc.subjectRadiation fluxen_US
dc.subjectNeutron fluenceen_US
dc.titleHelium ion irradiation behavior of Ni-1wt.%SiCNP composite and the effect of ion fluxen_US
dc.typeJournal Articleen_US
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