Nanocolumnar preferentially oriented PSZT thin films deposited on thermally grown silicon dioxide
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Date
2009-01
Journal Title
Journal ISSN
Volume Title
Publisher
Springer
Abstract
We report the first instance of deposition of preferentially oriented, nanocrystalline, and nanocolumnar strontium-doped lead zirconate titanate (PSZT) ferroelectric thin films directly on thermal silicon dioxide. No intermediate seed or activation layers were used between PSZT and silicon dioxide. The deposited thin films have been characterised using a combination of diffraction and microscopy techniques. © 2009, Springer.
Description
Keywords
Thin films, X-ray diffraction, Microscopy, Strontium, Doped materials, PZT
Citation
Sriram, S., Bhaskaran, M., Mitchell, A., Mitchell, D. R. G., & Kostovski, G. (2009). Nanocolumnar preferentially oriented PSZT thin films deposited on thermally grown silicon dioxide. Nanoscale Research Letters, 4(1), 29-33. doi:10.1007/s11671-008-9197-2