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Issue DateTitleAuthor(s)
2007Application of secondary ion mass spectrometry in studies of niobium segregation in niobium-doped titanium dioxideSheppard, LR; Atanacio, AJ; Bak, T; Nowotny, J; Prince, KE
19-Jul-2007Bulk diffusion of niobium in single-crystal titanium dioxideSheppard, LR; Atanacio, AJ; Bak, T; Nowotny, J; Prince, KE
15-Feb-2009Phase-oriented surface segregation in an aluminium casting alloy.Nguyen, CL; Atanacio, AJ; Zhang, W; Prince, KE; Hyland, MM; Metson, JB
12-Dec-2007Incorporation and activation of arsenic in MBE-grown HgCdTeTsen, GK; Sewell, RH; Atanacio, AJ; Prince, KE; Musca, CA; Dell, JM; Faraone, L
1-Jan-2008Mapping of elemental composition in air-oxidized Ti3SiC2Pang, WK; Low, IM; Prince, KE; Atanacio, AJ
7-Apr-2009Fabrication, structural characterization and testing of a nanostructured tin oxide gas sensorPartridge, JG; Field, MR; Sadek, AZ; Kalantar-zadeh, K; Du Plessis, J; Taylor, MB; Atanacio, AJ; Prince, KE; McCulloch, DG
12-Dec-2007An investigation of sol gel coated zirconia thin films on anodised titanium substrate by secondary ion mass spectrometry and scanning electron microscopyRoest, R; Atanacio, AJ; Latella, BA; Wuhrer, R; Ben-Nissan, B
1-Jan-2007Determination of niobium diffusion in titania and zirconia using secondary ion mass spectrometrySheppard, LR; Zhou, MF; Atanacio, AJ; Bak, T; Nowotny, J; Prince, KE
1-Aug-2009SIMS investigation on the 3C-SiC on SiHan, J; Dimitrijev, S; Kong, F; Atanacio, AJ

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