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Issue DateTitleAuthor(s)
2007Application of secondary ion mass spectrometry in studies of niobium segregation in niobium-doped titanium dioxideSheppard, LR; Atanacio, AJ; Bak, T; Nowotny, J; Prince, KE
25-Sep-2007Characterisation of phase relations and properties in air-oxidised Ti3SiC2Low, IM; Wren, E; Prince, KE; Atanacio, AJ
19-Jul-2007Bulk diffusion of niobium in single-crystal titanium dioxideSheppard, LR; Atanacio, AJ; Bak, T; Nowotny, J; Prince, KE
12-Dec-2007Incorporation and activation of arsenic in MBE-grown HgCdTeTsen, GK; Sewell, RH; Atanacio, AJ; Prince, KE; Musca, CA; Dell, JM; Faraone, L
12-Dec-2007An investigation of sol gel coated zirconia thin films on anodised titanium substrate by secondary ion mass spectrometry and scanning electron microscopyRoest, R; Atanacio, AJ; Latella, BA; Wuhrer, R; Ben-Nissan, B
1-Jan-2007Determination of niobium diffusion in titania and zirconia using secondary ion mass spectrometrySheppard, LR; Zhou, MF; Atanacio, AJ; Bak, T; Nowotny, J; Prince, KE

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