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https://apo.ansto.gov.au/dspace/handle/10238/10422| Title: | Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| Authors: | Kirkwood, HJ De Jonge, MD Howard, DL Ryan, CG Van Riessen, G Hofmann, F Rowles, MR Paradowska, AM Abbey, B |
| Keywords: | Diffraction Synchrotrons X-ray fluorescence analysis X-ray diffraction Tomography Polycrystals |
| Issue Date: | 26-Sep-2017 |
| Publisher: | Cambridge University Press |
| Citation: | Kirkwood, H., De Jonge, M., Howard, D., Ryan, C., Van Riessen, G., Hofmann, F., Rowles, M. R., Paradowska, A. M., & Abbey, B. (2017). Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector. Proceedings of the 2017 Australian X-ray Analytical Association workshops, conference, and exhibition. In Powder Diffraction, 32(S2), S16-S21. doi:10.1017/S0885715617000768 |
| Abstract: | Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil. © International Centre for Diffraction Data 2017 |
| URI: | https://doi.org/10.1017/S0885715617000768 https://apo.ansto.gov.au/dspace/handle/10238/10422 |
| ISSN: | 1945-7413 |
| Appears in Collections: | Conference Publications |
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