Browsing by Author Holland, AS
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
| Jan-2009 | In situ micro-Raman analysis and x-ray diffraction of nickel silicide thin films on silicon. | Bhaskaran, M; Sriram, S; Perova, TS; Ermakov, V; Thorogood, GJ; Short, KT; Holland, AS |
| Feb-2009 | Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates. | Sriram, S; Bhaskaran, M; Mitchell, DRG; Short, KT; Holland, AS; Mitchell, A |
