Browsing by Author Ermakov, V
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Issue Date | Title | Author(s) |
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Jan-2009 | In situ micro-Raman analysis and x-ray diffraction of nickel silicide thin films on silicon. | Bhaskaran, M; Sriram, S; Perova, TS; Ermakov, V; Thorogood, GJ; Short, KT; Holland, AS |