Browsing by Author Ermakov, V
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| Jan-2009 | In situ micro-Raman analysis and x-ray diffraction of nickel silicide thin films on silicon. | Bhaskaran, M; Sriram, S; Perova, TS; Ermakov, V; Thorogood, GJ; Short, KT; Holland, AS |