Browsing by Author Vittone, E

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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-Jan-2016Charge collection efficiency degradation induced by MeV ions in semiconductor devices: model and experimentVittone, E; Pastuovic, Z; Breese, M; Garcia Lopez, J; Jaksic, M; Raisanen, J; Siegele, R; Simon, A; Vizkelethy, G
13-May-2013Developing electronic devices capable of withstanding harsh radiationPastuovic, Z; Vittone, E; Siegele, R; Capan, I; Vizkelethy, G; Cohen, DD; Jaksic, M
15-Oct-2011Focused ion beam fabrication and IBIC characterisation of a diamond detector with buried electrodesOlivero, P; Forneris, J; Jakšić, M; Pastuovic, Z; Picollo, F; Skukan, N; Vittone, E
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E
15-Oct-2011Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottkey diodeOlivero, P; Forneris, J; Gamarra, P; Jakšić, M; Lo Giudice, A; Manfredotti, C; Pastuović, Ž; Skukan, N; Vittone, E
1-Aug-2014A Monte carlo software for the 1-dimensional simulation of IBIC experimentsForneris, J; Jaksic, M; Pastuovic, Z; Vittone, E
28-Feb-2011Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiationPastuovic, Z; Vittone, E; Capan, I; Jaksic, M
7-Jul-2014Radiation hardness of n-type SiC Schottky diodesPastuovic, Z; Vittone, E; Siegele, R; Ohshima, T; Iwamoto, N; Forneris, J; Cohen, DD; Capan, I