Browsing by Author Siegele, R

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Issue DateTitleAuthor(s)
1-Feb-2011Description of ANSTO’s confocal microprobe simulation programCohen, DD; Crawford, J; Siegele, R
13-May-2013Developing electronic devices capable of withstanding harsh radiationPastuovic, Z; Vittone, E; Siegele, R; Capan, I; Vizkelethy, G; Cohen, DD; Jaksic, M
Sep-2014Development of a large-area silicon α-particle detectorTran, LT; Prokopovich, DA; Lerch, MLF; Petasecca, M; Siegele, R; Reinhard, MI; Perevertaylo, V; Rosenfeld, AB
17-May-2010Development of accelerator based micro IBA techniques for the study of environmental samples and material characterisation.Cohen, DD; Siegele, R; Stelcer, E; Ionescu, M; Garton, D
Apr-2008Doiba manual: using PIXE and PIGE to their full potential with doiba.Siegele, R; Ionescu, M; Cohen, DD
1-Jan-2010Doping of ZnO thin film with Eu using ion beamsIonescu, M; Photongkam, P; Yu, DH; Siegele, R; Li, S; Cohen, DD
23-Mar-2009Electron transport properties of irradiated polyimide thin films in single track regime.Murugaraj, P; Mainwaring, DE; Siegele, R
15-Feb-2012Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiationIonescu, M; Winton, BR; Wexler, D; Siegele, R; Deslantes, A; Stelcer, E; Atanacio, AJ; Cohen, DD
Apr-2008Evaluation of specimen preparation techniques for micro-PIXE localisation of elements in hyperaccumulating plants.Kachenko, AG; Siegele, R; Bhatia, NP; Singh, B; Ionescu, M
Apr-2008Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon.Cohen, DD; Stelcer, E; Siegele, R; Ionescu, M; Prior, MJ
1-Jan-2012Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beams.Ionescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD
1-Nov-2013Formation of energetic heavy ion tracks in polyimide thin filmsDeslandes, A; Murugaraj, P; Mainwaring, DE; Ionescu, M; Cohen, DD; Siegele, R
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E
Apr-2008Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films.Ionescu, M; Zhao, Y; Siegele, R; Cohen, DD; Stelcer, E; Prior, MJ
Apr-1996High energy, heavy ion nuclear microprobe for ion beam research on the tandem accelerator at ANSTO.Cohen, DD; Siegele, R; Dytlewski, N
Dec-2010Improved electromechanical sensitivity of polymer thin films containing carbon clusters produced in situ by irradiation with metal ions.Murugaraj, P; Mainwaring, DE; Khelil, NA; Peng, JL; Siegele, R; Sawant, P
15-Jun-2009Improved resolution and sensitivity on the ANSTO microprobe and it's application to μ-PIXE.Siegele, R; Kachenko, AG; Ionescu, M; Cohen, DD
16-Sep-2013Influence of different mass absorption coefficient datasets on PIXE yieldsSiegele, R; Cohen, DD
1-Jul-2013Investigation of elemental changes in brain tissues following excitotoxic injurySiegele, R; Howell, NR; Callaghan, PD; Pastuovic, Z
15-Oct-2011Investigation of the mouse cerebellum using STIM and mu-PIXE spectrometric and FTIR spectroscopic mapping and imaging.Hackett, MJ; Siegele, R; El-Assaad, F; McQuillan, JA; Aitken, JB; Carter, EA; Grau, GE; Hunt, NH; Cohen, DD; Lay, PA