Browsing by Author Siegele, R

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Issue DateTitleAuthor(s)
14-Jan-2014The Centre for Accelerator Science at ANSTOHotchkis, MAC; Child, DP; Cohen, DD; Dodson, JR; Fink, D; Fujioka, T; Garton, D; Hua, Q; Ionescu, M; Jacobsen, GE; Levchenko, VA; Misfud, C; Pastuovic,Z; Siegele, R; Smith, AM; Wilcken, KM; Williams, AG
Jul-2007Characterisation of a ΔE–E particle telescope using the ANSTO heavy ion microprobe.Siegele, R; Reinhard, MI; Prokopovich, DA; Ionescu, M; Cohen, DD; Rosenfeld, AB; Cornelius, IM; Wroe, A; Lerch, MLF; Fazzi, A; Pola, A; Agosteo, S
Jul-2007Characterization of ion tracks in PMMA for single ion lithography.Alves, A; Johnston, PN; Reichart, P; Jamieson, DN; Siegele, R
1-Jan-2016Charge collection efficiency degradation induced by MeV ions in semiconductor devices: model and experimentVittone, E; Pastuovic, Z; Breese, M; Garcia Lopez, J; Jaksic, M; Raisanen, J; Siegele, R; Simon, A; Vizkelethy, G
21-Jul-2011Chemical alterations to murine brain tissue induced by formation fixation: implications for biospectroscopic imaging and mapping studies of disease pathogenesis.Hackett, MJ; McQuillan, JA; El-Assaad, F; Aitken, JB; Levina, A; Cohen, DD; Siegele, R; Carter, EA; Grau, GE; Hunt, NH; Lay, PA
Jan-2015Comparison of in vivo binding properties of the 18-kDa translocator protein (TSPO) ligands [18F]PBR102 and [18F]PBR111 in a model of excitotoxin-induced neuroinflammationCallaghan, PD; Wimberley, C; Rahardjo, GL; Berghofer, PJ; Pham, TQ; Jackson, T; Zahra, D; Bourdier, T; Wyatt, N; Greguric, I; Howell, NR; Siegele, R; Pastuovic, Z; Mattner, F; Loc'h, C; Gregoire, MC; Katsifis, A
22-Nov-2007Cylindrical silicon-on-insulator microdosimeter: charge collection characteristics.Ziebell, AL; Lim, WH; Reinhard, MI; Cornelius, IM; Prokopovich, DA; Siegele, R; Dzurak, AS; Rosenfeld, AB
1-Feb-2011Description of ANSTO’s confocal microprobe simulation programCohen, DD; Crawford, J; Siegele, R
13-May-2013Developing electronic devices capable of withstanding harsh radiationPastuovic, Z; Vittone, E; Siegele, R; Capan, I; Vizkelethy, G; Cohen, DD; Jaksic, M
Sep-2014Development of a large-area silicon α-particle detectorTran, LT; Prokopovich, DA; Lerch, MLF; Petasecca, M; Siegele, R; Reinhard, MI; Perevertaylo, V; Rosenfeld, AB
17-May-2010Development of accelerator based micro IBA techniques for the study of environmental samples and material characterisation.Cohen, DD; Siegele, R; Stelcer, E; Ionescu, M; Garton, D
Apr-2008Doiba manual: using PIXE and PIGE to their full potential with doiba.Siegele, R; Ionescu, M; Cohen, DD
1-Jan-2010Doping of ZnO thin film with Eu using ion beamsIonescu, M; Photongkam, P; Yu, DH; Siegele, R; Li, S; Cohen, DD
23-Mar-2009Electron transport properties of irradiated polyimide thin films in single track regime.Murugaraj, P; Mainwaring, DE; Siegele, R
15-Feb-2012Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiationIonescu, M; Winton, BR; Wexler, D; Siegele, R; Deslantes, A; Stelcer, E; Atanacio, AJ; Cohen, DD
Apr-2008Evaluation of specimen preparation techniques for micro-PIXE localisation of elements in hyperaccumulating plants.Kachenko, AG; Siegele, R; Bhatia, NP; Singh, B; Ionescu, M
Apr-2008Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon.Cohen, DD; Stelcer, E; Siegele, R; Ionescu, M; Prior, MJ
1-Jan-2012Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beams.Ionescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD
1-Nov-2013Formation of energetic heavy ion tracks in polyimide thin filmsDeslandes, A; Murugaraj, P; Mainwaring, DE; Ionescu, M; Cohen, DD; Siegele, R
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E