Localisation of trace metals in metal-accumulating plants using μ-PIXE
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Date
2008-03
Journal Title
Journal ISSN
Volume Title
Publisher
Wiley-Blackwell
Abstract
Particle induced x-ray emission (PIXE) is a very sensitive technique that can quickly and reliably measure a wide range of elements simultaneously with high sensitivity. Using a focused microbeam, elemental distributions can be mapped with high spatial resolution. We demonstrate high-resolution mapping of metals in plant leaves at 5 mu m resolution and its application in detecting sites of metal accumulation in metal-accumulating plant tissues. The importance of biological sample preparation is discussed by direct comparison of freeze-substitution and freeze-drying techniques routinely used in biological sciences. The advantages and limitations of quantitative elemental imaging using these techniques are also discussed. © 2008, Wiley-Blackwell.
Description
Keywords
PIXE analysis, Plants, Metals, Leaves, Plant tissues, Lyophilization
Citation
Siegele, R., Kachenko, A. G., Bhatia, N. P., Wang, Y. D., Ionescu, M., Singh, B., Baker, A. J. M., & Cohen, D. D. (2008). Localisation of trace metals in metal-accumulating plants using μ-PIXE. X-Ray Spectrometry, 37(2), 133-136. doi:10.1002/xrs.1035