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|Title: ||Localisation of trace metals in metal-accumulating plants using μ-PIXE.|
|Authors: ||Siegele, R|
|Keywords: ||PIXE Analysis|
|Issue Date: ||Mar-2008|
|Citation: ||Siegele, R., Kachenko, A. G., Bhatia, N. P., Wang, Y. D., Ionescu, M., Singh, B., et al. (2008). Localisation of trace metals in metal-accumulating plants using μ-PIXE. X-Ray Spectrometry, 37(2), 133-136.|
|Abstract: ||Particle induced x-ray emission (PIXE) is a very sensitive technique that can quickly and reliably measure a wide range of elements simultaneously with high sensitivity. Using a focused microbeam, elemental distributions can be mapped with high spatial resolution. We demonstrate high-resolution mapping of metals in plant leaves at 5 mu m resolution and its application in detecting sites of metal accumulation in metal-accumulating plant tissues. The importance of biological sample preparation is discussed by direct comparison of freeze-substitution and freeze-drying techniques routinely used in biological sciences. The advantages and limitations of quantitative elemental imaging using these techniques are also discussed. © 2008, Wiley-Blackwell. The definitive version is available at www3.interscience.wiley.com|
|Appears in Collections:||Journal Articles|
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