ANSTO Publications Online: Grazing incidence X-ray studies of ultra-thin Lumogen films.

Please use this identifier to cite or link to this item: http://apo.ansto.gov.au/dspace/handle/10238/992

Title:	Grazing incidence X-ray studies of ultra-thin Lumogen films.
Authors:	Keough, SJ Hanley, TL Wedding, AB Quinton, JS
Keywords:	Physical Vapor Deposition Thin Films Images Grazing Wavelengths Far Ultraviolet Radiation Quantum Efficiency Phosphors
Issue Date:	15-Dec-2007
Publisher:	Elsevier
Citation:	Keough, S. J., Hanley, T. L., Wedding, A. B., & Quinton, J. S. (2007). Grazing incidence X-ray studies of ultra-thin Lumogen films. Surface Science, 601(24), 5744-5749.
Abstract:	Lumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than 2nm) spin-coated films reveal a second, apparently stable crystalline structure. © 2007, Elsevier Ltd.
URI:	http://dx.doi.org/10.1016/j.susc.2007.06.053 http://apo.ansto.gov.au/dspace/handle/10238/992
ISSN:	0039-6028
Appears in Collections:	Journal Articles

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