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|Title: ||Grazing incidence X-ray studies of ultra-thin Lumogen films.|
|Authors: ||Keough, SJ|
|Keywords: ||Physical Vapor Deposition|
Far Ultraviolet Radiation
|Issue Date: ||15-Dec-2007|
|Citation: ||Keough, S. J., Hanley, T. L., Wedding, A. B., & Quinton, J. S. (2007). Grazing incidence X-ray studies of ultra-thin Lumogen films. Surface Science, 601(24), 5744-5749.|
|Abstract: ||Lumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than 2nm) spin-coated films reveal a second, apparently stable crystalline structure. © 2007, Elsevier Ltd.|
|Appears in Collections:||Journal Articles|
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