Few-layer graphene under high pressure: raman and x-ray diffraction studies

No Thumbnail Available
Date
2013-01-01
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
The effect of pressure on the structure of few-layer graphene has been investigated to 50 GPa in both quasi-hydrostatic and non-hydrostatic conditions, using X-ray diffraction and Raman spectroscopy. The results indicate that few-layer graphene loses its long-range order at the critical interlayer distance of ∼2.8 Å (or above ∼18 GPa), while maintaining the local sp2 hybridization in the layer to 50 GPa. This suggests that graphene not only has the highest stability of all graphitic layer structures, but also becomes one of the most healable structures under large stress. © 2012, Elsevier Ltd.
Description
Keywords
Graphene, X-ray diffraction, Raman spectroscopy, Synchrotron radiation, Stresses, Hydrostatics
Citation
Clark, S. M., Jeon, K. J., Chen, J. Y., & Yoo, C. S. (2013). Few-layer graphene under high pressure: raman and x-ray diffraction studies. Solid State Communications, 154(0), 15-18. doi:10.1016/j.ssc.2012.10.002
Collections