ANSTO Publications Online >
Journal Publications >
Journal Articles >

Please use this identifier to cite or link to this item: http://apo.ansto.gov.au/dspace/handle/10238/6235

Title: Few-layer graphene under high pressure: raman and X-ray diffraction studies
Authors: Clark, SM
Jeon, K-J
Chen, J-Y
Yoo, C-S
Keywords: GRAPHENE
X-RAY DIFFRACTION
RAMAN SPECTROSCOPY
SYNCHROTRON RADIATION
PRESSURE RANGE MEGA PA 10-100
HYDROSTATICS
Issue Date: 1-Jan-2013
Publisher: Elsevier
Citation: Clark, S. M., Jeon, K.-J., Chen, J.-Y., & Yoo, C.-S. (2013). Few-layer graphene under high pressure: Raman and X-ray diffraction studies. Solid State Communications, 154(0), 15-18.
Abstract: The effect of pressure on the structure of few-layer graphene has been investigated to 50 GPa in both quasi-hydrostatic and non-hydrostatic conditions, using X-ray diffraction and Raman spectroscopy. The results indicate that few-layer graphene loses its long-range order at the critical interlayer distance of ∼2.8 Å (or above ∼18 GPa), while maintaining the local sp2 hybridization in the layer to 50 GPa. This suggests that graphene not only has the highest stability of all graphitic layer structures, but also becomes one of the most healable structures under large stress. © 2012, Elsevier Ltd.
URI: http://dx.doi.org/10.1016/j.ssc.2012.10.002
http://apo.ansto.gov.au/dspace/handle/10238/6235
ISSN: 0038-1098
Appears in Collections:Journal Articles

Files in This Item:

There are no files associated with this item.

Items in APO are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback