ANSTO Publications Online >
Journal Publications >
Journal Articles >
Please use this identifier to cite or link to this item:
|Title: ||Projection process modelling for iterative reconstruction of Pinhole SPECT|
|Authors: ||Lin, J|
|Keywords: ||SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY|
|Issue Date: ||1-Oct-2010|
|Abstract: ||In iterative reconstruction of pinhole SPECT data, the forward and back projection processes are often performed using the ray tracing method. Ray tracing is computationally efficient, but it has the drawback of poor reconstruction quality due to the missing voxel effect and textural artefacts. In this paper, the pinhole projection process was modelled starting from consideration of all the main factors affecting pinhole projection, such as voxel shape, penetration of the pinhole edges and detector response. Next, approximations were made to reduce the computational speed and the effect of the approximations on reconstructed image accuracy was evaluated in simulation and phantom experiments and compared with the ray tracing algorithm. When used in conjunction with the ML-EM algorithm, the proposed model improved reconstructed image accuracy compared with the ray tracing method and achieved comparable computational efficiency. Therefore, the proposed projection model is a practical alternative to the ray tracing algorithm for pinhole SPECT reconstruction.© 2010, Institute of Electrical and Electronics Engineers (IEEE)|
|Appears in Collections:||Journal Articles|
Files in This Item:
There are no files associated with this item.
Items in APO are protected by copyright, with all rights reserved, unless otherwise indicated.