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Please use this identifier to cite or link to this item: http://apo.ansto.gov.au/dspace/handle/10238/4939

Title: Stress/Strain Induced Flux Pinning in Highly Dense MgB Bulks
Authors: Zeng, R
Dou, SX
Lu, L
Li, WX
Poh, CK
Kim, JH
Horvat, J
Shi, DQ
Wang, JL
Munroe, P
Wang, XF
Zheng, RK
Ringer, SP
Rindfleisch, M
Tomsic, M
Keywords: STRAINS
STRESSES
MAGNETIC FLUX
BEHAVIOR
POWDERS
MICROSTRUCTURE
Issue Date: 1-Jun-2009
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Zeng, R., Dou, S. X., Lu, L., Li, W. X., Poh, C. K., Kim, J. H., Horvat, J., Shi, D. Q., Wang, J. L., Munroe, P., Wang, X. F., Zheng, R. K., Ringer, S. P., Rindfleisch, M., & Tomsic, M. (2009). Stress/Strain Induced Flux Pinning in Highly Dense MgB Bulks. IEEE Transactions of Applied Superconductivity, 19 (3), 2722-2725.
Abstract: We have systematically studied the flux pinning behavior of MgB(2) bulks synthesized by direct diffusion of Mg into pressed pellets of high purity crystalline B powder, with and without mixing with C and SiC nanoparticles, at a reaction temperature of 850 degrees C for 10 hrs. All of the samples showed very high purity and high density, but their microstructure and flux pinning behavior showed significant differences. It was found that the pure MgB(2) agrees with the delta T(c) pinning model, nano-C doped MgB(2) agrees with the delta l pinning model, while the SiC + MgB(2) composite agrees with the delta epsilon pinning model (stress/strain field pinning), since the dominant micro-defects that influence the flux pinning in these three samples are different. © 2009, Institute of Electrical and Electronics Engineers (IEEE)
URI: http://dx.doi.org/10.1109/tasc.2009.2019577
http://apo.ansto.gov.au/dspace/handle/10238/4939
ISSN: 1051-8223
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