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|Title: ||Probing the structure of nanochannal arrays by electrostatic force microscopy|
|Authors: ||Murugaraj, P|
|Issue Date: ||1-Apr-2011|
|Publisher: ||World Scientific Publishing Co.|
|Citation: ||Murugaraj, P., Kumar, N., Jakubov, T., Mainwaring, D. E. (2011). Probing the structure of nanochannal arrays by electrostatic force microscopy. International Conference Nanomeeting - 2011, 24th-27th May 2011. Minsk, Belarus. In V. E. Borisenko, S. V. Gaponenko, V.S. Gurin, C. H. Kam( Eds.), Physics, Chemistry and Applications of Nonostructures: Reviews and Short Notes - Proceedings of the International Conference Nanomeeting - 2011 (PP. 241-244). World Scientific Publishing Company.|
|Abstract: ||Electrostatic force microscopy (EFM) represents a versitile tool for the characterisation of electric and dielectric structures at nanoscale which can be employed to provide charge distributions associated with such nanotopologies. EFM-phase profiles show only the variation of electrostatic force which is strongly influenced by the surface conductivity of nanostructured arrays providing improved definition compared to conventional AFM. Here we apply it to carbon nanochannel arrays embedded within polyimide dielectric matrices. Copyright © 2012 World Scientific Publishing Co. All rights reserved|
|Appears in Collections:||Book Chapters|
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