ANSTO Publications Online >
Journal Publications >
Journal Articles >
Please use this identifier to cite or link to this item:
|Title: ||The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns|
|Authors: ||Fuentes-Montero, L|
|Keywords: ||X-ray Diffraction|
|Issue Date: ||1-Feb-2011|
|Citation: ||Fuentes-Montero, L., Montero-Cabrera, M.E., Fuentes-Cobas, L. (2011). The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns. Journal of Applied Crystallography, 44(Part 1), 241-246.|
|Abstract: ||A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented. © 2011, Wiley-Blackwell. The definitive version is available at www3.interscience.wiley.com|
|Appears in Collections:||Journal Articles|
Files in This Item:
There are no files associated with this item.
Items in APO are protected by copyright, with all rights reserved, unless otherwise indicated.