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Please use this identifier to cite or link to this item: http://apo.ansto.gov.au/dspace/handle/10238/3943

Title: The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns
Authors: Fuentes-Montero, L
Montero-Cabrera, ME
Fuentes-Cobas, L
Keywords: X-ray Diffraction
Texture
Crystallography
Scattering
Polycrystals
Images
Issue Date: 1-Feb-2011
Publisher: Wiley-Blackwell
Citation: Fuentes-Montero, L., Montero-Cabrera, M.E., Fuentes-Cobas, L. (2011). The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns. Journal of Applied Crystallography, 44(Part 1), 241-246.
Abstract: A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented. © 2011, Wiley-Blackwell. The definitive version is available at www3.interscience.wiley.com
URI: http://dx.doi.org/10.1107/S0021889810048739
http://apo.ansto.gov.au/dspace/handle/10238/3943
ISSN: 0021-8898
Appears in Collections:Journal Articles

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