ANSTO Publications Online >
Journal Publications >
Journal Articles >

Please use this identifier to cite or link to this item:

Title: The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns
Authors: Fuentes-Montero, L
Montero-Cabrera, ME
Fuentes-Cobas, L
Keywords: X-ray Diffraction
Issue Date: 1-Feb-2011
Publisher: Wiley-Blackwell
Citation: Fuentes-Montero, L., Montero-Cabrera, M.E., Fuentes-Cobas, L. (2011). The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns. Journal of Applied Crystallography, 44(Part 1), 241-246.
Abstract: A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented. © 2011, Wiley-Blackwell. The definitive version is available at
ISSN: 0021-8898
Appears in Collections:Journal Articles

Files in This Item:

There are no files associated with this item.

Items in APO are protected by copyright, with all rights reserved, unless otherwise indicated.


Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback