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ANSTO Publications Online >
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Journal Articles >
Please use this identifier to cite or link to this item:
http://apo.ansto.gov.au/dspace/handle/10238/3205
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| Title: | Lattice guiding for low temperature crystallization of rhombohedral perovskite-structured oxide thin films. |
| Authors: | Sriram, S Bhaskaran, M Mitchell, DRG Mitchell, A |
| Keywords: | Thin Films Crystallization PZT Transmission Electron Microscopy X-Ray Diffraction Lattice Parameters |
| Issue Date: | Feb-2010 |
| Publisher: | American Chemical Society |
| Citation: | Sriram, S., Bhaskaran, M., Mitchell, D. R. G., & Mitchell, A. (2010). Lattice guiding for low temperature crystallization of rhombohedral perovskite-structured oxide thin films. Crystal Growth & Design, 10(2), 761-764. |
| Abstract: | Low temperature crystallization of complex oxide thin films has proved to be a challenge with deposition of such materials often carried out at elevated temperatures in excess of 600°C. This article demonstrates one of the first instances of deposition of preferentially oriented strontium-doped lead zirconate titanate thin films at a relatively low temperature of 300°C. This was achieved by carrying out deposition on gold-coated silicon substrates which exert a guiding influence on thin film growth due to similarity in lattice parameters. The microstructure and preferential orientations were studied using high resolution transmission electron microscopy and X-ray diffraction. These results illustrated the pronounced texture in the deposited thin films due to lattice guiding, with crystal structure simulations also verifying the guiding effect. © 2010, American Chemical Society |
| URI: | http://dx.doi.org/10.1021/cg901165j http://apo.ansto.gov.au/dspace/handle/10238/3205 |
| ISSN: | 1528-7483 |
| Appears in Collections: | Journal Articles |
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