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|Title: ||Lattice guiding for low temperature crystallization of rhombohedral perovskite-structured oxide thin films.|
|Authors: ||Sriram, S|
|Keywords: ||Thin Films|
Transmission Electron Microscopy
|Issue Date: ||Feb-2010|
|Publisher: ||American Chemical Society|
|Citation: ||Sriram, S., Bhaskaran, M., Mitchell, D. R. G., & Mitchell, A. (2010). Lattice guiding for low temperature crystallization of rhombohedral perovskite-structured oxide thin films. Crystal Growth & Design, 10(2), 761-764. doi:10.1021/cg901165j|
|Abstract: ||Low temperature crystallization of complex oxide thin films has proved to be a challenge with deposition of such materials often carried out at elevated temperatures in excess of 600°C. This article demonstrates one of the first instances of deposition of preferentially oriented strontium-doped lead zirconate titanate thin films at a relatively low temperature of 300°C. This was achieved by carrying out deposition on gold-coated silicon substrates which exert a guiding influence on thin film growth due to similarity in lattice parameters. The microstructure and preferential orientations were studied using high resolution transmission electron microscopy and X-ray diffraction. These results illustrated the pronounced texture in the deposited thin films due to lattice guiding, with crystal structure simulations also verifying the guiding effect. © 2010, American Chemical Society|
|Appears in Collections:||Journal Articles|
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