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ANSTO Publications Online >
ANSTO Publications >
Scientific and Technical Reports >
Please use this identifier to cite or link to this item:
http://apo.ansto.gov.au/dspace/handle/10238/311
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| Title: | Deep level transient spectroscopy of y-ray induced defects in germanium. |
| Authors: | Pearton, SJ Williams, AA Tavendale, AJ |
| Issue Date: | Dec-1980 |
| Publisher: | Australian Nuclear Science and Technology Organisation |
| Abstract: | Deep level transient capacitance spectroscopy has been used to examine γ-ray induced defect centres in germanium crystals grown under widely varying conditions. A deep acceptor level at Eν + 0.38 eν has been observed for the first time in all p-type samples; this was removed by annealing at 675 deg C for three hours. A new deep donor level at Eс - 0.42 eν observed in n-type material was not removed by this procedure. |
| URI: | http://apo.ansto.gov.au/dspace/handle/10238/311 |
| ISBN: | 0642596999 |
| Appears in Collections: | Scientific and Technical Reports |
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